Schematic of the measurement setup, together with the sample arrangement used in the measurements. G0 is the source grating, G1 is the beam splitter grating used for the phase stepping, and G2 is the analyzer grating.
Simulated visibility of an interferometer with a Si phase grating of height between 5 and 50 keV, scanned with an ideal absorption grating (dashed line) and an absorption grating with high Au bars (solid line).
Reconstructed absorber thickness from a measurement of a square aluminum bar as a function of the real absorber thickness . Beam hardening effects lead to an increasing underestimation of the absorber thickness.
(a) Attenuation-contrast and (b) differential phase-contrast radiography of a square aluminum bar with cross section. (c) and (d) are the respective horizontal profiles averaged along the vertical direction of the image. Unlike the ideal values at the monochromatic effective energy (dashed line), the measured values (solid line) decrease with growing absorber thickness due to beam hardening.
(a) Attenuation-contrast and (b) differential phase-contrast radiography of two square aluminum bars with and cross section and a cylinder of 5 mm diameter. (c) and (d) are the corresponding reconstructed height profiles of the vertically averaged samples, as measured with beam hardening (dashed-dotted line), corrected for beam hardening (solid line), and compared to the real thickness of the samples (dashed line).
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