Free-in-air exposed XR-RV3 film calibration setup.
GafChromic XR-RV3 film layers (Ref. 31). Note: The “yellow” polyester layer side of the film actually looks orange.
Reflective density versus air kerma for UW80-M beam quality. Red, green, and blue channels isolated and analyzed separately.
Air kerma versus reflective density of the calibration films exposed free-in-air to the four beam qualities. (a) Orange side of the film facing the x-ray source. (b) White side of the film facing the x-ray source.
Energy dependence of XR-RV3 film versus air kerma. Normalized to UW120-M beam quality film response.
Comparison of the primary GSF 80 (120 kVp) spectrum to the primary plus scatter spectrum incident upon the simulated air at and the active layer of the simulated film (the orange side facing the x-ray source) for the on-phantom geometry.
Air kerma versus reflective density of the calibration films exposed free-in-air, plotted together with uncorrected free-in-air air kerma versus on-phantom RD and corrected on-phantom air kerma versus on-phantom RD. (The orange side facing the x-ray source; UW120-M beam.)
Energy deposited in the film layers under free-in-air conditions, sampled in thick segments (GSF 80 primary spectra). Primary x rays enter the film from left side of the plot and exit on the right side of the plot .
Contour plot of the pixel values of the uncorrected stitched image of the calibration film exposed free-in-air to 570 cGy air kerma, positioned and scanned separately at 42 different scanner bed locations on the Epson 10000XL scanner.
Measured scanner profiles for each of the ten film darkness levels. The polynomial best-fit curves, excluding the outliers, are plotted as the dashed lines through the data points.
Contour plot of the pixel values of the corrected stitched image of the calibration film exposed free-in-air to 570 cGy air kerma, positioned and scanned separately at 42 different scanner bed locations on the Epson 10000XL scanner.
Tungsten anode x-ray beam qualities for NIST, UW-ADCL, and Monte Carlo GSF beam codes, including the first HVL and homogeneity coefficients (HC).
Monte Carlo simulated beam characteristics of GSF spectra incident upon air at under free-in-air conditions and under PMMA phantom backscatter conditions.
Example uncertainty analysis for measured film data from UW80-M data, expressed as percent.
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