Detector simulation scenarios. (a) Indirect detection (scintillator-detector): x-rays to light conversion and detection. (b) Direct detection (photoconductor-detector): x-rays to electrons conversion and detection. (c) Simple detector.
Structure of the detector simulator described in this work.
Scheme of the detector reference system. (Left) Detector reference; (Right) Final image reference with respect to the detector reference.
(A) Total PFS function overlapped to the surface of the detector; (B) total PSF mask laid on the detector matrix (gray levels are reversed).
(a) Experimental noise image (“DRK”). (b) Example of experimental image inhomogeneity. The shown image is one of the “I0” data set. In both images, gray levels were stretched in order to better show the effects of the amplifiers. (c) Noise map calculated from three DRK image using Eq. (17). (d) Inhomogeneity map calculated using Eq. (18).
Comparison plots of the experimental and simulated MTF curves.
Comparison plots of the experimental and simulated nNPS curves.
Comparison plots of the experimental and simulated NEQ curves.
List of the characteristics of the computers used in benchmark tests.
List of characteristics of the experimental setup used to validate the simulation.
List of experimental measurements and parameters.
Detector execution time on different platform (mean ± standard deviation).
Detector model parameters: scintillator standard deviation expressed in μm and pixel units, vADC gain and pixel efficiency.
Article metrics loading...
Full text loading...