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Two-frequency interferometer for a displacement measurement
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10.1119/1.4746815
/content/aapt/journal/ajp/81/2/10.1119/1.4746815
http://aip.metastore.ingenta.com/content/aapt/journal/ajp/81/2/10.1119/1.4746815
View: Figures

Figures

Image of Fig. 1.
Fig. 1.

Heterodyne-detection apparatus for displacement measurements. OSC: oscillator, MOD: special modulator, BS: non-polarizing beam splitter, LP: linear polarizer, PD: photodetector, CH: oscilloscope channel, : polarizing beam splitter for the Michelson interferometer, M: mirror, and PZT: piezoelectric transducer.

Image of Fig. 2.
Fig. 2.

Acousto-optic modulator (AOM) and polarizing optics used to produce a sideband with a polarization perpendicular to that of the carrier. HWP: half-wave plate. This assembly plays the role of the special modulator (MOD) in Fig. 1 .

Image of Fig. 3.
Fig. 3.

Beating signals from the photodetector before the interferometer (squares) and after the interferometer (circles).

Image of Fig. 4.
Fig. 4.

Measured displacements of mirror when the PZT voltage is ramped up (squares) and down (circles). The error bars are smaller than the size of the squares and circles.

Image of Fig. 5.
Fig. 5.

Drift of the measured displacements of mirror at a fixed PZT voltage. The displacements are measured at 20-s intervals.

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/content/aapt/journal/ajp/81/2/10.1119/1.4746815
2013-01-22
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Two-frequency interferometer for a displacement measurement
http://aip.metastore.ingenta.com/content/aapt/journal/ajp/81/2/10.1119/1.4746815
10.1119/1.4746815
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