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Capacitance-voltage profiling: Research-grade approach versus low-cost alternatives
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10.1119/1.4864162
/content/aapt/journal/ajp/82/3/10.1119/1.4864162
http://aip.metastore.ingenta.com/content/aapt/journal/ajp/82/3/10.1119/1.4864162
/content/aapt/journal/ajp/82/3/10.1119/1.4864162
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/content/aapt/journal/ajp/82/3/10.1119/1.4864162
2014-03-01
2014-10-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Capacitance-voltage profiling: Research-grade approach versus low-cost alternatives
http://aip.metastore.ingenta.com/content/aapt/journal/ajp/82/3/10.1119/1.4864162
10.1119/1.4864162
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