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Volume 83, Issue 2, February 2015

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FEATURED ARTICLE
  • Scanning capacitance microscopy using a relaxation oscillator
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38d913362403a4a254fa758cb6527ba5 journal.issuezxybnytfddd
Scitation: American Journal of Physics - Browse
http://aip.metastore.ingenta.com/content/aapt/journal/ajp/83/2
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