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/content/aip/journal/adva/1/3/10.1063/1.3624474
2011-07-29
2016-12-08

Abstract

We report a relatively precise method of conductivity measurement in a diamond anvil cell with axis symmetrical electrodes and finite difference calculation. The axis symmetrical electrodes are composed of two parts: one is a round thin-filmelectrode deposited on diamond facet and the other is the inside wall of metal gasket. Due to the asymmetrical configuration of the two electrodes,finite difference method can be applied to calculate the conductivity of sample, which can reduce the measurement error.

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/deliver/fulltext/aip/journal/adva/1/3/1.3624474.html;jsessionid=BZkD53_3ID4H6Tvepbpdp3f9.x-aip-live-02?itemId=/content/aip/journal/adva/1/3/10.1063/1.3624474&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/adva
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=aipadvances.aip.org/1/3/10.1063/1.3624474&pageURL=http://scitation.aip.org/content/aip/journal/adva/1/3/10.1063/1.3624474'
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