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Dynamically controlled charge sensing of a few-electron silicon quantum dot
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/content/aip/journal/adva/1/4/10.1063/1.3654496
2011-10-12
2014-12-21

Abstract

We report charge sensing measurements of a siliconmetal-oxide-semiconductorquantum dot using a single-electron transistor as a chargesensor with dynamic feedback control. Using digitally-controlled feedback, the sensor exhibits sensitive and robust detection of the charge state of the quantum dot, even in the presence of charge drifts and random charge upset events. The sensor enables the occupancy of the quantum dot to be probed down to the single electron level.

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Scitation: Dynamically controlled charge sensing of a few-electron silicon quantum dot
http://aip.metastore.ingenta.com/content/aip/journal/adva/1/4/10.1063/1.3654496
10.1063/1.3654496
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