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Optical and electrical properties of spray pyrolysis deposited nano-crystalline BiFeO3 films
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1.
1. Henglin A , Chem. Rev. 89 1861 (1989).
http://dx.doi.org/10.1021/cr00098a010
2.
2. Agfeldt A and Gratzel M , Chem.Rev. 95, 49 (1995).
http://dx.doi.org/10.1021/cr00033a003
3.
3. Banerjee R , Jayakrishnan R and Ayyub P , J. Phys.: Condens. Matter 12, 10647 (2000).
http://dx.doi.org/10.1088/0953-8984/12/50/325
4.
4. Ganeev R A , Baba M , Morita M , Rau D , Fujii H , Ryasnyansky A I , Ishizawa N , Suzuki M and Kuroda H , J.Opt. A: Pure Appl. Opt. 6, 447 (2004).
http://dx.doi.org/10.1088/1464-4258/6/4/024
5.
5. Beecroft L L and Ober C K , Chem. Mater. 9, 1302 (1997).
http://dx.doi.org/10.1021/cm960441a
6.
6. Liu Y C , Xu H Y , Mu R , Henderson D O , Lu Y M , Zhang J Y , Shen D Z , Fan X W and White C W , Appl. Phys. Lett. 83, 1210 (2003).
http://dx.doi.org/10.1063/1.1591248
7.
7. S. J. Clark and J. Robertson, Appl. Phys. Lett. 90, 132903 (2007).
http://dx.doi.org/10.1063/1.2716868
8.
8. P. Fischer, M. Polomska, I. Sosnowska, and M. Szymanskig, J.Phys.C 13, 1931 (1980).
http://dx.doi.org/10.1088/0022-3719/13/10/012
9.
9. Seung-Hyub Baek, Chad M. Folkman, Jae-Wan Park, Sanghan Lee, Chung-Wung Bark, Thomas Tybell, Chang-Beom Eom, Adv.Mater.xx, 1-5 (2011).
10.
10. V. V. Shvartsman, W. Kleemann, R. Haumont, and J. Kreisel, Appl. Phys. Lett. 90, 172115 (2007).
http://dx.doi.org/10.1063/1.2731312
11.
11. D. Lebeugle, D. Colson, A. Forget, M. Viret, P. Bonville, J. F. Marucco, and S. Fusil, Phys. Rev. B 76, 024116 (2007).
http://dx.doi.org/10.1103/PhysRevB.76.024116
12.
12. J. B. Neaton, C. Ederer, U. V. Waghmare, N. A. Spaldin, and K. M. Rabe, Phys.Rev.B 71, 014113 (2005).
http://dx.doi.org/10.1103/PhysRevB.71.014113
13.
13. S. J. Clark and J. Robertson, Appl.Phys.Lett. 90, 132903 (2007).
http://dx.doi.org/10.1063/1.2716868
14.
14. R. Palai, R. S. Katiyar, H. Schmid, P. Tissot, S. J. Clark, J. Robertson, S. A. T. Redfern, G. Catalan, J. F. Scott, Phys, Rev.B, 77, 014110 (2008).
http://dx.doi.org/10.1103/PhysRevB.77.014110
15.
15. Y. Xu, M. Shen, Mat.Lett. 62, 3600 (2008).
http://dx.doi.org/10.1016/j.matlet.2008.04.006
16.
16. Takeshi Kawae, Hisashi Tsuda, and Akiharu Morimoto, Appl.Phys.Express 1, 051601 (2008).
http://dx.doi.org/10.1143/APEX.1.051601
17.
17. V. Fruth, E. Tenea, M. Gartner, A. Anastasescu, D. Berger, R. Ramer, and M. Zaharescu, J. Eur. Ceram. Soc. 27, 937 (2007).
http://dx.doi.org/10.1016/j.jeurceramsoc.2006.04.135
18.
18. T. Kanai, S. Ohkoshi, and K. Hashimoto, J. Phys. Chem. Solids 64, 391 (2003).
http://dx.doi.org/10.1016/S0022-3697(02)00284-6
19.
19. F. Gao, Y. Yuan, K. F. Wang, X. Y. Chen, F. Chen, and J. M. Liu, Appl. Phys. Lett. 89, 102506 (2006).
http://dx.doi.org/10.1063/1.2345825
20.
20. Waren B E , X-ray diffraction (Reading, MA: Addison-Wesely) p-26419.
21.
21. B. Elidrissi, M. Addo, M. Regragui, C. Monty, A. Bougrine, and A. Kachouane, Thin Solid Films 379, 23 (2000).
http://dx.doi.org/10.1016/S0040-6090(00)01404-8
22.
22. Moses A. E. R , Nehru L. C , Jayachandra M , and Sanjeeviraja C , Cryst.Res.Technol. 42, 867 (2007).
http://dx.doi.org/10.1002/crat.200710918
23.
23. S. Logothetidis, J. Appl. Phys. 65, 2416 (1983).
http://dx.doi.org/10.1063/1.343401
24.
24. A. Kumar, R. C. Rai, N. J. Podraza, S. Denev, M. Ramirez, Y.-H. Chu, L. W. Martin, J. Ihlefeld, T. Heeg, J. Schubert, D. G. Schlom, J. Orenstein, R. Ramesh, R. W. Collins, J. L. Musfeldt, and V. Gopalan, Appl. Phys. Lett. 92, 121915 (2008).
http://dx.doi.org/10.1063/1.2901168
25.
25. Cameliu Himcinschi, Ionela Vrejoiu, Marion Friedrich, Li Ding, Christoph Cobet, Norbert Esser, Marin Alexe, and Dietrich R. T. Zahn , Phys. Status Solidi C 7, 296 (2010).
http://dx.doi.org/10.1002/pssc.200982414
26.
26. K. L. Chopra, Thin Film Phenomena (Mc Graw-Hill, New York, 1969).
27.
27. J. C. Manifacier, M. D. Murcia, J. P. Fillard, E. Vicario, Thin Solid Films 41 127 (1997).
http://dx.doi.org/10.1016/0040-6090(77)90395-9
28.
28. Z. G. Hu, F. W. Shi, T. Lin, Z. M. Huang, G. S. Wang, Y. N. Wu, J. H. Chu, Phys. Lett. A 320, 478 (2004).
http://dx.doi.org/10.1016/j.physleta.2003.12.003
29.
29. F. W. Shi, Z. G. Hu, G. S. Wang, T. Lin, J. H. Ma, X. J. Meng, J. L. Sun, J. H. Chu, Thin Solid Films 458, 223 (2004).
http://dx.doi.org/10.1016/j.tsf.2003.09.059
30.
30. Z. Huang, X. Meng, Z. Zhang, J. Chu, J. Phys. D Appl. Phys. 35, 246 (2002).
http://dx.doi.org/10.1088/0022-3727/35/3/313
31.
31. Pancov J , Optical Processes in Semiconductors (Englewood Cliffs, NJ: Prentice-Hall, 1979).
32.
32. Peng Chen, Xiaoshan Xu, Christopher Koenigsmann, Alexander C. Santulli, Stanislaus S. Wong, and Janice L. Musfeldt, Nano Lett. 10, 4526 (2010).
http://dx.doi.org/10.1021/nl102470f
33.
33. Vilas Shelke, Dipanjan Mazumdar, Sergey Faleev, Oleg Mryasov, Stephen jesse, Sergei Kalinin, Arthur Baddorf and Arunava Gupta, Materials Science, arXiv:1010.0604v2.
34.
34. P. Chen, N. J. Podraza, X. S. Xu, A. Melville, E. Vlahos, V. Gopalan, R. Ramesh, D. G. Schlom, and J. L. Musfeldt, Appl. Phys. Lett. 96, 131907 (2010).
http://dx.doi.org/10.1063/1.3364133
35.
35. A. D. Yoffe, Adv.phys. 42, 173 (1993).
http://dx.doi.org/10.1080/00018739300101484
36.
36. N. Benramdane, W. A. Murad, R. H. Misho, M. Ziane, Z. Kebbab, Mater. Chem. Phys. 48, 119 (1997).
http://dx.doi.org/10.1016/S0254-0584(97)80104-6
37.
37. Swanepoel R , J. Phys., E J. Sci. Instrum, 16, 1214 (1983).
http://dx.doi.org/10.1088/0022-3735/16/12/023
38.
38. T. Wiktorezyk, Thin Solid Films 405, 238 (2002).
http://dx.doi.org/10.1016/S0040-6090(01)01760-6
39.
39. Chang Q. Sun, Progress in Solid State Chemistry, 35, 1 (2007).
http://dx.doi.org/10.1016/j.progsolidstchem.2006.03.001
40.
40. H. Wang, Y. Zheng, M.-Q. Cai, H. Huang, and H. L. W. Chan, Solid State Commun. 149, 641 (2009).
http://dx.doi.org/10.1016/j.ssc.2009.01.023
41.
41. H. Yang, Y. Q. Wang, 2 H. Wang, and Q. X. Jia, Appl. Phys. Lett. 96, 012909 (2010).
http://dx.doi.org/10.1063/1.3291044
42.
42. T. Choi, S. Lee, Y. J. Choi, V. Kiryukhin, W. W. Chong, Science, 324, 3 (2009).
43.
43. J. E. Brus, J. Chem. Phys. 80, 4403 (1984).
http://dx.doi.org/10.1063/1.447218
44.
44. A. D. Yoffe, Adv. Phys. 42, 173 (1993).
http://dx.doi.org/10.1080/00018739300101484
45.
45. Y. Z. Wang, G. W. Qiao, X. D. Liu, B. Z. Ding, and Z. Q. Hu, Mater. Lett. 17, 152 (1993).
http://dx.doi.org/10.1016/0167-577X(93)90075-9
46.
46. I. Bakonyi, E. Toth-Kadar, T. Tarnoczi, L. Varga, A. Cziraki, I. Gerocs, and B. Fogarassy, Nanostruct. Mater. 3, 155 (1993).
http://dx.doi.org/10.1016/0965-9773(93)90073-K
47.
47. L. Wu, W. Tien-Shou, and W. Chung-Chuang, J. Phys. D: Appl. Phys. 13, 259 (1980).
http://dx.doi.org/10.1088/0022-3727/13/2/023
48.
48. A. J. Hauser, J. Zhang, L. Miee, R. A. Ricciardo, P. M. Woodward, T. L. Gustafson, L. J. Brillson, and F. Y. Yang, Appl. Phys. Lett. 92, 222901 (2008).
http://dx.doi.org/10.1063/1.2939101
49.
49. M. A. Lampert and P. Mark, Current Injection in Solids (Academic, New York, 1970).
50.
50. J. Frenkel, Tech. Phys. USSR 5, 685 (1938).
51.
51. G. W. Pabst, L. W. Martin, Y. H. Chu, and R. Ramesh, Appl. Phys. Lett. 90, 072902 (2007).
http://dx.doi.org/10.1063/1.2535663
52.
52. B. Nagaraj, S. Aggarwal, T. K. Song, T. Sawhney, and R. Ramesh, Phys. Rev. B 59, 16022 (1999).
http://dx.doi.org/10.1103/PhysRevB.59.16022
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Figures

Image of FIG. 1.

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FIG. 1.

Spray-pyrolysis experimental set-up.

Image of FIG. 2.

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FIG. 2.

Typical XRD patterns of BFO films deposited at 350 °C and 400 °C.

Image of FIG. 3.

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FIG. 3.

AFM surface micrographs of the BFO films deposited at (a) 300 °C, (b) 350 °C, (c) 400 °C and (d) the mean grain size, D and RMS roughness as a function of substrate temperature.

Image of FIG. 4.

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FIG. 4.

(a) Transmittance and (b) absorbance spectra for BFO films with different grain size, D. Inset: close up view of absorbance below 450 nm.

Image of FIG. 5.

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FIG. 5.

Absorption coefficient (α) as a function of wavelength of the BFO films with different grain size. Inset: the plots of dα/dE vs. hν.

Image of FIG. 6.

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FIG. 6.

Plots of (αhυ)2 vs. hν of the BFO films with different grain size. Inset: the variation in band gap with the average grain size of BFO.

Image of FIG. 7.

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FIG. 7.

(a) Extinction coefficient, (b) refractive index, (c) real and (d) imaginary parts of dielectric constant as a function of wavelength of the BFO films with different grain size.

Image of FIG. 8.

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FIG. 8.

(a) Typical leakage current data and (b) plots of ln(σ) vs. V0.5 of the BFO films. Inset in (a): schematic drawing of device structure.

Tables

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Table I.

Various calculated parameters of the BFO films

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/content/aip/journal/adva/1/4/10.1063/1.3662093
2011-11-04
2014-04-21

Abstract

The nano-crystalline BiFeO3 were prepared under controlled substrate temperature by spray pyrolysis method. Their structural, optical and electrical properties were studied and correlated. A blueshift (Δλ ∼ 8.17 nm) in the absorbance peaks was observed in the films with decrease in grain size. The absorption coefficient spectra show defect transitions at 1.9 and 2.3 eV in large grain size films due to oxygen vacancies. The lowest leakage was observed in smaller grain size (< 20 nm) films due to negligible oxygen vacancies, smooth surface roughness and large energy bang gap. The Poole-Frankel conduction mechanism has been found to be the predominant mechanism for the leakage current.

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Scitation: Optical and electrical properties of spray pyrolysis deposited nano-crystalline BiFeO3 films
http://aip.metastore.ingenta.com/content/aip/journal/adva/1/4/10.1063/1.3662093
10.1063/1.3662093
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