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/content/aip/journal/adva/2/4/10.1063/1.4757917
1.
1.M. Wang, R. P. Campion, A. W. Rushforth, K. W. Edmonds, C. T. Foxon, and B. L. Gallagher, Appl. Phys. Lett. 93, 132103 (2008).
http://dx.doi.org/10.1063/1.2992200
2.
2.L. Chen, X. Yang, F. Yang, J. Zhao, J. Misuraca, P. Xiong, and S. von Molnár, Nano Lett. 11, 2584 (2011).
http://dx.doi.org/10.1021/nl201187m
3.
3.H. Ohno, A. Shen, F. Matsukura, A. Oiwa, A. Endo, S. Katsumoto, and Y. Iye, Appl. Phys. Lett. 69, 363 (1996).
http://dx.doi.org/10.1063/1.118061
4.
4.M. Abolfath, T. Jungwirth, J. Brum, and A. H. MacDonald, Phys. Rev. B 63, 054418 (2001).
http://dx.doi.org/10.1103/PhysRevB.63.054418
5.
5.J. Sadowski, R. Mathieu, P. Svedlindh, J. Z. Domagala, J. Bak-Misiuk, K. Światek, M. Karlsteen, J. Kanski, L. Ilver, H. Åsklund, and U. Södervall, Appl. Phys. Lett. 78, 3271 (2001).
http://dx.doi.org/10.1063/1.1370535
6.
6.J. Sadowski and J. Z. Domagala, Phys. Rev. B 69, 075206 (2004).
http://dx.doi.org/10.1103/PhysRevB.69.075206
7.
7.W. K. Chu, J. W. Mayer, and M. A. Nicolet, Backscattering Spectrometry (Academic, New York, 1978).
8.
8.K. M. Yu, W. Walukiewicz, T. Wojtowicz, I. Kuryliszyn, X. Liu, Y. Sasaki, and J. K. Furdyna, Phys. Rev. B 65, 201303R (2002).
http://dx.doi.org/10.1103/PhysRevB.65.201303
9.
9.M. Sawicki, F. Matsukura, A. Idziaszek, T. Dietl, G. M. Schott, C. Ruester, C. Gould, G. Karczewski, G. Schmidt, and L. W. Molenkamp, Phys. Rev. B 70, 245325 (2004).
http://dx.doi.org/10.1103/PhysRevB.70.245325
10.
10.L. Chen, S. Yan, P. F. Xu, J. Lu, J. J. Deng, Y. Ji, K. Y. Wang, and J. H. Zhao, J. Magn. Magn. Mater. 322, 32503254 (2010).
http://dx.doi.org/10.1016/j.jmmm.2010.06.002
11.
11.U. Welp, V. K. Vlasko-Vlasov, A. Manzel, H. D. You, X. Liu, J. K. Furdyna, and T. Wojtowicz, Appl. Phys. Lett. 85, 260 (2004).
http://dx.doi.org/10.1063/1.1771801
12.
12.S. Piano, X. Marti, A. W. Rushforth, K. W. Edmonds, R. P. Campion, M. Wang, O. Caha, T. U. Schülli, V. Holý, and B. L. Gallagher, Appl. Phys. Lett. 98, 152503 (2011).
http://dx.doi.org/10.1063/1.3579534
13.
13.M. Kopecký, J. Kub, F. Máca, J. Mašek, O. Pacherová, A. W. Rushforth, B. L. Gallagher, R. P. Campion, V. Novák, and T. Jungwirth, Phys. Rev. B 83, 235324 (2011).
http://dx.doi.org/10.1103/PhysRevB.83.235324
14.
14.M. Sawicki, K.-Y. Wang, K. W. Edmonds, R. P. Campion, C. R. Staddon, N. R. S. Farley, C. T. Foxon, E. Papis, E. Kamińska, A. Piotrowska, T. Dietl, and B. L. Gallagher, Phys. Rev. B 71, 121302 (2005).
http://dx.doi.org/10.1103/PhysRevB.71.121302
15.
15.Y. B. Xu, D. J. Freeland, M. Tselepi, and J. A. C. Bland, Phys. Rev. B 62, 11671170 (2000).
http://dx.doi.org/10.1103/PhysRevB.62.1167
16.
16.O. Thomas, Q. Shen, P. Schieffer, N. Tournerie, and B. Lépine, Phys. Rev. Lett. 90, 017205 (2003).
http://dx.doi.org/10.1103/PhysRevLett.90.017205
17.
17.M. F. Wu, C. Chen, D. Zhu, S. Zhou, A. Vantomme, G. Langouche, B. S. Zhang and H. Yang, Appl. Phys. Lett. 80, 4130 (2002).
http://dx.doi.org/10.1063/1.1483389
18.
18.S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, and N. Franco, Appl. Phys. Lett. 79, 1432 (2001).
http://dx.doi.org/10.1063/1.1397276
19.
19.K. Lorenz, N. Franco, E. Alves, I. M. Watson, R. W. Martin, and K. P. O’Donnell, Phy. Rev. Lett. 97, 085501 (2006).
http://dx.doi.org/10.1103/PhysRevLett.97.085501
20.
20.K. Nakajima, S. Joumori, M. Suzuki, K. Kimura, T. Osipowicz, K. L. Tok, J. Z. Zheng, A. See, and B. C. Zhang, Appl. Phys. Lett. 83, 296 (2003).
http://dx.doi.org/10.1063/1.1592310
21.
21.S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, C. Trager-Cowan, F. Sweeney, and E. Alves, Phys. Rev. B 64, 205311 (2001).
http://dx.doi.org/10.1103/PhysRevB.64.205311
22.
22.M. Birowska, C. Śliwa, J. A. Majewski, and T. Dietl, Phys. Rev. Lett. 108, 237203 (2012).
http://dx.doi.org/10.1103/PhysRevLett.108.237203
23.
23.M. Kopecký, J. Kub, F. Máca, J. Mašek, O. Pacherová, A. W. Rushforth, B. L. Gallagher, R. P. Campion, V. Novák, and T. Jungwirth, Phys. Rev. B 83, 235324 (2011).
http://dx.doi.org/10.1103/PhysRevB.83.235324
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/content/aip/journal/adva/2/4/10.1063/1.4757917
2012-10-02
2016-02-08

Abstract

We provide a direct measurement of the tetragonal distortion in thick GaMnAs as a function of depth by Rutherford backscattering combining with channeling. The thick GaMnAs film is tetragonally strained and the tetragonal distortion is found to be depth independent. Our finding excludes strain relaxation as the origin of the uniaxial in-plane magnetic anisotropy observed in GaMnAs.

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