No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Growth of graphene underlayers by chemical vapor deposition
3. P. Blake, D. P. Brimicombe, R. R. Nair, T. J. Booth, Da. Jiang, F. Schedin, L. A. Ponomarenko, S. V. Morozov, H. F. Gleeson, E. W. Hill, A. K. Geim, and K. S. Novoselov, Nano Lett. 8, 1704 (2008).
4. K. S. Kim, Y. Zhao, H. Jang, S. Y. Lee, J. M. Kim, K. S. Kim, J. H. Ahn, P. Kim, J. Y. Choi, and B. H. Hong, Nature 457, 706 (2009).
8. X. Li, W. Cai, J. An, S. Kim, J. Nah, D. Yang, R. Piner, A. Velamakanni, I. Jung, E. Tutuc, S. K. Banerjee, L. Colombo, and R. S. Ruoff, Science 324, 1312 (2009).
10. E. G. Acheson, United States Patent 568323 (1896).
30. Q. Li, H. Chou, J. Zhong, J. Liu, A. Dolocan, J. Zhang, Y. Zhou, R. S. Ruoff, S. Chen, and W. Cai, Nano Lett. 13, 486 (2013).
31. W. Fang, A. L. Hsu, R. Caudillo, Y. Song, A. G. Birdwell, E. Zakar, M. Kalbac, M. Dubey, T. Palacios, M. S. Dresselhaus, P. T. Araujo, and J. Kong, Nano Lett. 13, 1541 (2013).
35. L. Gao, W. Ren, H. Xu, L. Jin, Z. Wang, T. Ma, L. P. Ma, Z. Zhang, Q. Fu, L. Peng, X. Bao, and H. Cheng, Nature Commun. 3, 699 (2012).
38. S. J. Chae, F. Gunes, K. K. Kim, E. S. Kim, G. H. Han, S. M. Kim, H. Shin, S. Yoon, J. Choi, M. H. Park, C. W. Yang, D. Pribat, and Y. H. Lee, Adv. Mater. 21, 2328 (2009).
Article metrics loading...
We present a simple and very convincing approach to visualizing that subsequent layers of graphene grow between the existing monolayer graphene and the copper catalyst in chemical vapor deposition (CVD). Graphene samples were grown by CVD and then transferred onto glass substrates by the bubbling method in two ways, either direct-transfer (DT) to yield poly (methyl methacrylate) (PMMA)/graphene/glass or (2) inverted transfer (IT) to yield graphene/PMMA/glass. Field emission scanning electron microscopy (FE-SEM) and atomic force microscopy (AFM) were used to reveal surface features for both the DT and IT samples. The results from FE-SEM and AFM topographic analyses of the surfaces revealed the underlayer growth of subsequent layers. The subsequent layers in the IT samples are visualized as 3D structures, where the smaller graphene layers lie above the larger layers stacked in a concentric manner. The results support the formation of the so-called “inverted wedding cake” stacking in multilayer graphene growth.
Full text loading...
Most read this month