No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
11. A. Auge, N. Teichert, M. Meinert, G. Reiss, A. Hütten, E. Yuzuak, I. Dincer, Y. Elerman, I. Ennen, and P. Schattschneider, Phys. Rev. B 85, 21 (2012).
20. T. Kanomata, K. Fukushima, H. Nishihara, R. Kainuma, W. Itoh, K. Oikawa, K. Ishida, K. U. Neumann, and K. R. A. Ziebeck, Materials Science Forum 583, 119–129 (2008).
Article metrics loading...
A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni 50Mn32Sn18 thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.
Full text loading...
Most read this month