No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Three-dimensional measurement of a tightly focused laser beam
1. M. Born and E. Wolf, Principles of Optics, 7th (expanded) ed. (Cambridge, United Kingdom, 1999).
3. L. Novotny, Principles of nano-optics (Cambridge University Press, 2006).
22. D. W. Pohl and D. Courjon, Near Field Optics (Kluwer Acad demic, Dordrecht, 1993).
23. R. C. Gonzalez and R. E. Woods, Digital image processing, 3rd ed. (Publishing House of Electronics Industry, Beijing, 2010).
Article metrics loading...
The spatial structure of a tightly focused light field is measured with a double knife-edge scanning method. The measurement method is based on the use of a high-quality double knife-edge fabricated from a right-angled silicon fragment mounted on a photodetector. The reconstruction of the three-dimensional structures of tightly focused spots is carried out with both uniform and partially obstructed linearly polarized incident light beams. The optical field distribution is found to deviate substantially from the input beam profile in the tightly focused region, which is in good agreement with the results of numerical simulations.
Full text loading...
Most read this month