No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Crystal structure of Co/Cu multilayers prepared by pulse potential electrodeposition with precisely controlled ultrathin layer thickness
1. Á. Cziráki, M. Köteles, L. Péter, Z. Kupay, J. Pádár, L. Pogány, I. Bakonyi, M. Uhlemann, M. Herrich, B. Arnold, J. Thomas, H. D. Bauer, and K. Wetzig, Thin Solid Films 433, 237 (2003).
5. ASM Handbook Committee, Metals handbook 8th ed. vol. 8 (American Society for Metals, Ohio, 1973), p. 287.
16. I. Y. Protsenko, I. V. Cheshko, and J. Javorsky, Funct. Mater. 13, 219 (2006).
Article metrics loading...
Co/Cu multilayers were electrodeposited in a single electrolyte using the pulse potential method and the layer thickness was precisely controlled in accordance with Faraday's law. X-ray diffraction revealed that multilayers with layer thicknesses in the range of 25–100 nm consisted of fcc-Co and fcc-Cu phases. For layers thinner than 10 nm, the fcc-Co and fcc-Cu phases merged to form a single crystal phase. When the layers were <1 nm, one diffraction peak of the single crystal phase became proportionally higher as the layer became thinner. The surface structure of multilayers also varied with the layer thickness.
Full text loading...
Most read this month