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1.
1. L. Morin, N. Ben Jemaa, D. Jeannot, and H. Sone in Proceedings of 47th IEEE Holm Conference on Electrical Contacts (2001), p. 88.
2.
2. A. Anders, Cathodic Arcs (Springer, New York, 2008).
3.
3. P. Fauchais, J. F. Coubert, M. Vardelle, A. Vardelle, and A. Denoirjean, J. Thermal Spray Tech. 1, 117 (1992).
http://dx.doi.org/10.1007/BF02659011
4.
4. A. Vardelle, M. Vardelle, H. Zhang, N. J. Themelis, and K. Gross, J. Thermal Spray Tech. 11, 244 (2002).
http://dx.doi.org/10.1361/105996302770348907
6.
6. J. B. A. Mitchell, S. di Stasio, J. L. LeGarrec, A. I. Florescu-Mitchell, T. Narayanan, and M. Sztucki, Journal of Applied Physics 105, 124904 (2009).
http://dx.doi.org/10.1063/1.3147902
7.
7. J. B. A. Mitchell, J. Courbe, A. I. Florescu-Mitchell, S. di Stasio, and T. Weiss, Journal of Applied Physics 100, 124918 (2006).
http://dx.doi.org/10.1063/1.2400105
8.
8. J. B. A. Mitchell, J. L. LeGarrec, M. Sztucki, T. Nayaranan, V. Dikhtyar, and E. Jerby, Phys. Rev. Lett. 100, 065001 (2008).
http://dx.doi.org/10.1103/PhysRevLett.100.065001
9.
9. E. Jerby, A. Golts, Y. Shamir, S. Wonde, J. B. A. Mitchell, J. L. LeGarrec, T. Narayanan, M. Sztucki, D. Ashkenazi, Z. Barkay, and N. Eliaz, Appl. Phys. Lett. 95, 191501 (2009).
http://dx.doi.org/10.1063/1.3259781
10.
10. L. Lavisse, J.-L. Le Garrec, L. Hallo, J.-M. Jouvard, S. Carles, J. Perez, J. B. A. Mitchell, J. Decloux, M. Girault, V. Potin, H. Andrzejeweski, M. C. Marco de Lucas, and S. Bourgeois, App. Phys. Lett. 100, 164103 (2012).
http://dx.doi.org/10.1063/1.4703930
12.
12. E. Carvou and N. Ben Jemaa, “Electrical arc study in the range of 14-112 VDC for automotive power contactsProc. of the 23rd International Conference on Electrical Contacts; Sendai (Japan), pp 2833, 2006.
13.
13. A. Guinier, X-Ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies (Dover Publications, Inc, New York, 1994).
14.
14. G. Beaucage, J. Appl. Cryst. 28, 717 (1995).
http://dx.doi.org/10.1107/S0021889895005292
15.
15. G. Beaucage, Phys. Rev. E 70, 031401 (2004).
http://dx.doi.org/10.1103/PhysRevE.70.031401
16.
16. J. Ilavsky, J. Appl. Cryst. 42, 347 (2009).
http://dx.doi.org/10.1107/S0021889809002222
17.
17. M. Merit and Y. Zhang, (www.caam.rice.edu/caam/trs/2004/TR04-08.pdf).
18.
18. G. Beaucage, H. K. Kammler, and S. E. Pratsinis, J. Appl. Cryst. 37, 523 (2004).
http://dx.doi.org/10.1107/S0021889804008969
19.
19. J. B. A. Mitchell, J. L. LeGarrec, and S. di Stasio, AIP Conf. Proc. 1370, 47 (2011).
http://dx.doi.org/10.1063/1.3638081
20.
20. J. Swingler and J. W. McBride in Proceedings of 41st IEEE Holm Conference on Electrical Contacts (2001), p. 88.
21.
21. J. Swingler and J. W. McBride, IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A 19, 404 (1996).
http://dx.doi.org/10.1109/95.536842
22.
22. N. S. Tabrizi, M. Ullmann, V. A. Vons, U. Lafont, and A. Schmidt-Ott, J. Nanopart. Res. 11, 315 (2009).
http://dx.doi.org/10.1007/s11051-008-9407-y
23.
23. N. S. Tabrizi, Q. Xu, N. M. van der Pers, and A. Schmidt-Ott, J. Nanopart. Res. 12, 247 (2010).
http://dx.doi.org/10.1007/s11051-009-9603-4
24.
24. I. Sondi and B. Salopek-Sondi, J. Colloid and Interface Science, 275, 177 (2004).
http://dx.doi.org/10.1016/j.jcis.2004.02.012
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/content/aip/journal/adva/3/3/10.1063/1.4799061
2013-03-27
2016-12-07

Abstract

Small Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified from the liquid state. Particles collected around the electrodes were analyzed by Transmission Electron Microscopy and were seen to be much larger than those seen in the SAXS measurement, to be spherical in form and composed of silver metal with irregular tin oxide particles deposited on their surface. Mixed metal nanoparticles can have important practical applications and the use of mixed sintered electrodes may be a direct method for their production.

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