No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells
2. C.-C. Chen, L. Dou, R. Zhu, C.-H. Chung, T.-B. Song, Y. B. Zheng, S. Hawks, G. Li, P. S. Weiss, and Y. Yang, Acs Nano 6, 7185 (2012).
3. L. Dou, J. You, J. Yang, C.-C. Chen, Y. He, S. Murase, T. Moriarty, K. Emery, G. Li, and Y. Yang, Nat. Photonics 6, 180 (2012).
5. M. Pfannmöller, H. Fluügge, G. Benner, I. Wacker, C. Sommer, M. Hanselmann, S. Schmale, H. Schmidt, F. A. Hamprecht, T. Rabe, W. Kowalsky, and R. R. Schröder, Nano Lett. 11, 3099 (2011).
13. N. Yao, editor, Focused Ion Beam Systems: Basics and Applications, Reissue (Cambridge University Press, 2011).
Article metrics loading...
We prepared cross sections of P3HT:PCBM bulk heterojunction (BHJ) organic solar cells (OSCs) for the characterization of their potential distribution with scanning Kelvin probe microscopy. We compared results of samples obtained by microtome cutting of OSCs on plastic substrates, cleaving of OSCs on glass substrates, and milling with a focused ion beam. Their potential distributions were in good agreement with each other. Under short circuit conditions, potential gradients were detected in vicinity of the electrode/organics interfaces, with negligible electric fields within the bulk. We contacted the OSCs in a defined manner and studied their potential distribution under operating conditions.
Full text loading...
Most read this month