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1. M. Z. Hasan and C. L. Kane, Rev. Mod. Phys. 82, 3045 (2010).
2. Xiao-Liang Qi and Shou-Cheng Zhang, Rev. Mod. Phys. 83, 1057 (2011).
3. Dimitrie Culcer, Physica E 44, 860 (2012).
4. D. Hsieh, D. Qian, L. Wray, Y. Xia, Y. S. Hor, R. J. Cava, and M. Z. Hasan, Nature 452, 970 (2008).
5. Y. L. Chen, J. G. Analytis, J.-H. Chu, Z. K. Liu, S.-K. Mo, X. L. Qi, H. J. Zhang, D. H. Lu, X. Dai, Z. Fang, S. C. Zhang, I. R. Fisher, Z. Hussain, and Z.-X. Shen, Science 325, 178 (2009).
6. Y. Xia, D. Qian, D. Hsieh, L. Wray, A. Pal, H. Lin, A. Bansil, D. Grauer, Y. S. Hor, R. J. Cava, and M. Z. Hasan, Nat. Phys. 5, 398 (2009).
7. Lihong Bao, Liang He, Nicholas Meyer, Xufeng Kou, Peng Zhang, Zhi-gang Chen, Alexei V. Fedorov, Jin Zou, Trevor M. Riedemann, Thomas A. Lograsso, Kang L. Wang, Gary Tuttle, and Faxian Xiu, Sci. Rep. 2, 726 (2012).
8. T. Arakane, T. Sato, S. Souma, K. Kosaka, K. Nakayama, M. Komatsu, T. Takahashi, Zhi Ren, Kouji Segawa, and Yoichi Ando, Nat. Commun. 3, 636 (2012).
9.See supplementary material at for details of calculation for the thickness dependence of resistivity for samples with varying degrees of surface and bulk conduction. [Supplementary Material]
10.When we say surface is more conducting or insulating than the bulk, we imply that the 3D resistivity of the surface layer is respectively, greater than or less than the bulk resistivity. The surface resistivity ρS is related to the surface resistance RS and to the thickness of surface layer tS by the relation ρS = RStS.
11. A. A. Taskin, Kouji Segawa, and Yoichi Ando, Phys. Rev. B 82, 121302 (2010).
12. Helin Cao, Jifa Tian, Ireneusz Miotkowski, Tian Shen, Jiuning Hu, Shan Qiao, and Yong P. Chen, Phys. Rev. Lett. 108, 216803 (2012).
13. James G. Analytis, Ross D. McDonald, Scott C. Riggs, Jiun-Haw Chu, G. S. Boebinger, and Ian R. Fisher, Nat. Phys. 6, 960 (2010).
14. Dong-Xia Qu, Y. S. Hor, Jun Xiong, R. J. Cava, and N. P. Ong, Science 329, 821 (2010).
15. A. A. Taskin, Satoshi Sasaki, Kouji Segawa, and Yoichi Ando, Phys. Rev. Lett. 109, 066803 (2012).
16. N. P. Butch, K. Kirshenbaum, P. Syers, A. B. Sushkov, G. S. Jenkins, H. D. Drew, and J. Paglione, Phys. Rev. B 81, 241301 (2010).
17. Yong Seung Kim, Matthew Brahlek, Namrata Bansal, Eliav Edrey, Gary A. Kapilevich, Keiko Iida, Makoto Tanimura, Yoichi Horibe, Sang-Wook Cheong, and Sheongshik Oh, Phys. Rev. B 84, 073109 (2011).
18. Namrata Bansal, Young Seung Kim, Matthew Brahlek, Eliav Edrey, and Sheongshik Oh, Phys. Rev. Lett 109, 116804 (2012).
19. Kazuma Eto, Zhi Ren, A. A. Taskin, Kouji Segawa, and Yoichi Ando, Phys. Rev. B 81, 195309 (2010).
20. James G. Analytis, Jiun-Haw Chu, Yulin Chen, Felipe Corredor, Ross D. McDonald, Z. X. Shen, and Ian R. Fisher, Phys. Rev. B 81, 205407 (2010).
21. J. G. Checkelsky, Y. S. Hor, M.-H. Liu, D.-X. Qu, R. J. Cava, and N. P. Ong, Phys. Rev. Lett. 103, 246601 (2009).
22. Y. S. Hor, A. Richardella, P. Roushan, Y. Xia, J. G. Checkelsky, A. Yazdani, M. Z. Hasan, N. P. Ong, and R. J. Cava, Phys. Rev. B 79, 195208 (2009).
23. Y. S. Hor, D. Qu, N. Pong, and R. J. Cava, J. Phys.: Condens. Matter 22, 375801 (2010).
24. Zhi Ren, A. A. Taskin, Satoshi Sasaki, and Kouji Segawa and Yoichi Ando, Phys. Rev. B 82, 241306 (2010).
25. Jun Xiong, A. C. Petersen, Dongxia Qu, Y. S. Hor, R. J. Cava, and N. P. Ong, Physica E 44, 917 (2012).
26. A. A. Taskin, Zhi Ren, Satoshi Sasaki, Kouji Segawa, and Yoichi Ando, Phys. Rev. Lett. 107, 016801 (2011).
27. A. A. Taskin and Yoichi Ando, Phys. Rev. B 80, 085303 (2009).
28. Hao Tang, Dong Liang, Richard L. J. Qiu, and Xuan P. A. Gao, ACS Nano 5, 7510 (2011).
29. Namrata Bansal, Young Seung Kim, Matthew Brahlek, Eliav Edrey, and Sheongshik Oh, arXiv:1104.5709 (2011).
30. DongXia Qu, Transport Studies of Topological Insulators. United States – New Jersey: Princeton University (2011). (Retrieved from (898954355))
31. Bin Xia, Peng Ren, Azat Sulaev, Peng Liu, Shun-Qing Shen, and Lan Wang, Phys. Rev. B 87, 085442 (2013).
32. Hongtao He, Baikui Li, Hongchao Liu, Xin Guo, Ziyan Wang, Maohai Xie, and Jiannong Wang, App. Phys. Lett. 100, 032105 (2012).

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In this report, we scrutinize the thickness dependent resistivity data from the recent literature on electrical transport measurements in topological insulators. A linear increase in resistivity with increase in thickness is expected in the case of these materials since they have an insulating bulk and a conducting surface. However, such a trend is not seen in the resistivity versus thickness data for all the cases examined, except for some samples, where it holds for a range of thickness.


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