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Thickness dependence of magnetoelectric response for composites of Pb(Zr0.52Ti0.48)O3 films on CoFe2O4 ceramic substrates
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    Affiliations:
    1 State Key Laboratory of Mechanics and Control of Mechanical Structures, College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
    2 School of Electronics and Information Engineering, Guizhou University, Guiyang 550025, China
    3 School of Materials Science and Engineering, and State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084, China
    a) These authors contributed to the work equally and should be regarded as co-first authors
    b) Author to whom correspondence should be addressed. Electronic mail: wang-jing@nuaa.edu.cn
    AIP Advances 4, 087127 (2014); http://dx.doi.org/10.1063/1.4893542
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/content/aip/journal/adva/4/8/10.1063/1.4893542
2014-08-18
2014-10-21

Abstract

Using chemical solution spin-coating we grew Pb(ZrTi)O films of different thicknesses on highly dense CoFeO ceramics. X-ray diffraction revealed no other phases except Pb(ZrTi)O and CoFeO. In many of these samples we observed typical ferroelectric hysteresis loops, butterfly-shaped piezoelectric strains, and the magnetic-field-dependent magnetostriction. These behaviors caused appreciable magnetoelectric responses based on magnetic-mechanical-electric coupling. Our results indicated that the thickness of the Pb(ZrTi)O film was important in obtaining strong magnetoelectric coupling.

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Scitation: Thickness dependence of magnetoelectric response for composites of Pb(Zr0.52Ti0.48)O3 films on CoFe2O4 ceramic substrates
http://aip.metastore.ingenta.com/content/aip/journal/adva/4/8/10.1063/1.4893542
10.1063/1.4893542
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