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/content/aip/journal/adva/4/8/10.1063/1.4894074
1.
1. M. E. Davis, Nature 417, 813821 (2002).
http://dx.doi.org/10.1038/nature00785
2.
2. G. Korotcenkov and B. Cho, Critical Reviews in Solid State and Materials Sciences 35, 153260 (2010).
http://dx.doi.org/10.1080/10408436.2010.495446
3.
3. J. M. Buriak, Philos. Trans. R. Soc. London Ser. A 364, 217225 (2006).
http://dx.doi.org/10.1098/rsta.2005.1681
4.
4. M. Tiemann, Chemistry - A European Journal 13, 83768388 (2007).
http://dx.doi.org/10.1002/chem.200700927
5.
5. C. Baratto, G. Faglia, G. Sberveglieri, Z. Gaburro, L. Pancheri, C. Oton, and L. Pavesi, Sensors 2, 121126 (2002).
http://dx.doi.org/10.3390/s20300121
6.
6. L. Pancheri, C. Oton, Z. Gaburro, G. Soncini, and L. Pavesi, Sensors and Actuators B: Chemical 89, 237239 (2003).
http://dx.doi.org/10.1016/S0925-4005(02)00471-9
7.
7. E. Garrone et al., Adv. Mater. 17, 528531 (2005).
http://dx.doi.org/10.1002/adma.200401200
8.
8. L. Boarino et al., Mater. Sci. Eng. B 69, 210214 (2000).
http://dx.doi.org/10.1016/S0921-5107(99)00267-6
9.
9. V. Y. Timoshenko, T. Dittrich, and F. Koch, Phys. Status Solidi B 222, R1R2 (2000).
http://dx.doi.org/10.1002/1521-3951(200011)222:23.0.CO;2-J
10.
10. G. Amato et al., J. App. Phys. 114, 204302 (2013).
http://dx.doi.org/10.1063/1.4834576
11.
11. M. A. Henderson, Surf. Sci. Rep. 66, 185297 (2011).
12.
12. L. Mino, G. Agostini, E. Borfecchia, D. Gianolio, A. Piovano, E. Gallo, and C. Lamberti, J. Phys. D: App. Phys. 46, 423001 (2013).
http://dx.doi.org/10.1088/0022-3727/46/42/423001
13.
13. V. Galstyan, E. Comini, G. Faglia, A. Vomiero, L. Borghese, E. Bontempi, and G. Sberviglieri, Nanotechnology 23, 235706 (2012).
http://dx.doi.org/10.1088/0957-4484/23/23/235706
14.
14. M. Gratzel, Inorg. Chem. 44, 68416851 (2005).
http://dx.doi.org/10.1021/ic0508371
15.
15. A. Cultrera, L. Boarino, G. Amato, and C. Lamberti, J. Phys. D: App. Phys. 47, 015102 (2014).
http://dx.doi.org/10.1088/0022-3727/47/1/015102
16.
16. C. Faivre, D. Bellet, and G. Dolino, Eur. Phys. J. B 7, 1936 (1999).
http://dx.doi.org/10.1007/s100510050586
17.
17. I. Schechter, M. Ben-Chorin, and A. Kux, J. Anal. Chem. 67, 37273732 (1995).
http://dx.doi.org/10.1021/ac00116a018
18.
18. G. Gesele, J. Linsmeier, V. Drach, J. Fricke, and R. Arens-Fischer, J. Phys. D: App. Phys. 30, 2911 (1997).
http://dx.doi.org/10.1088/0022-3727/30/21/001
19.
19. V. Y. Timoshenko, T. Dittrich, V. Lysenko, M. G. Lisachenko, and F. Koch, Phys. Rev. B 64, 085314 (2001).
http://dx.doi.org/10.1103/PhysRevB.64.085314
20.
20. V. Lehmann, F. Hofmann, F. Möller, and U. Grüning, Thin Solid Films 255, 2022 (1995).
http://dx.doi.org/10.1016/0040-6090(94)05624-M
21.
21. D. Stroud, Superlattices and microstructures 23, 567573 (1998).
http://dx.doi.org/10.1006/spmi.1997.0524
22.
22. B. Urbach, E. Axelrod, and A. Sa'ar, Phys. Rev. B 75, 205330 (2007).
http://dx.doi.org/10.1103/PhysRevB.75.205330
23.
23. I. Smallwood, Handbook of Organic Solvent Properties (Butterworth-Heinemann, 1996).
24.
24. S. A. Studenikin, N. Golego, and M. Cocivera, J. App. Phys. 84, 50015004 (1998).
http://dx.doi.org/10.1063/1.368746
25.
25. N. Golego, S. Studenikin, and M. Cocivera, J. Electrochem. Soc. 147, 15921594 (2000).
http://dx.doi.org/10.1149/1.1393400
26.
26. G. Munuera, V. Rives-Arnau, and A. Saucedo, J. Chem. Soc. Faraday Trans. 1 75, 736747 (1979).
http://dx.doi.org/10.1039/f19797500736
27.
27. R. Van de Krol and H. Tuller, Solid State Ionics 150, 167179 (2002).
http://dx.doi.org/10.1016/S0167-2738(02)00273-4
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/content/aip/journal/adva/4/8/10.1063/1.4894074
2014-08-25
2016-09-26

Abstract

We developed an integrated system for photo-electrical characterization of materials for sensing applications in strictly controlled environment conditions. The peculiar aspect of this setup is the capability of a fine-tuned gas dosage and a fast dynamic chamber pressure control, coupled with current and voltage sensing within a modified cryostat. To illustrate the capabilities of our system we have characterised both p+-type mesoporous silicon (meso-PS) membranes and nano-crystalline mesoporous titanium dioxide (nc-TiO) films. In particular, as a main topic is presented a well-resolved characterization of mesoporous silicon electrical conductivity changes induced by presence of ethanol. At low pore filling level adsorbate-shunted conduction is avoided, while dielectric screening effects on frozen doping centres are observable. Beside we presented observation of mesoporous titanium dioxide photo-conductivity as a function of different gas pressure reporting opposite effects of relatively low- and high-pressure regimes. High reproducibility provided by the system is discussed as a final remark.

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