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/content/aip/journal/adva/5/11/10.1063/1.4936398
2015-11-19
2016-09-29

Abstract

A set of r.f. sputter depositedZnO thin films prepared with different Mn doping concentrations have been characterised by Extended X-rayAbsorption Fine Structure (EXAFS) and X-rayAbsorption Near Edge Spectroscopy(XANES) measurements at Zn, Mn and O K edges and at Mn L edges apart from long range structural characterisation by Grazing Incident X-ray Diffraction (GIXRD) technique. Magnetic measurements show room temperature ferromagnetism in samples with lower Mn doping which is however, gets destroyed at higher Mn doping concentration. The results of the magnetic measurements have been explained using the local structure information obtained from EXAFS and XANES measurements.

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