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1.
1.R. García and R. Perez, Surf. Sci. Rep. 47, 197 (2002).
http://dx.doi.org/10.1016/S0167-5729(02)00077-8
2.
2.B. D. Huey, Annu. Rev. Mater. Res. 37, 351 (2007).
http://dx.doi.org/10.1146/annurev.matsci.37.052506.084331
3.
3.B. Cretin and F. Sthal, Appl. Phys. Lett. 62, 829 (1993).
http://dx.doi.org/10.1063/1.108592
4.
4.U. Rabe and W. Arnold, Appl. Phys. Lett. 64, 1493 (1994).
http://dx.doi.org/10.1063/1.111869
5.
5.K. Yamanaka, H. Ogiso, and O. Kolosov, Appl. Phys. Lett. 64, 178 (1994).
http://dx.doi.org/10.1063/1.111524
6.
6.O. V. Kolosov, M. R. Castell, C. D. Marsh, G. A. D. Briggs, T. I. Kamins, and R. S. Williams, Phys. Rev. Lett. 81, 1046 (1998).
http://dx.doi.org/10.1103/PhysRevLett.81.1046
7.
7.K. B. Crozier, G. G. Yaralioglu, F. L. Degertekin, J. D. Adams, S. C. Minne, and C. F. Quate, Appl. Phys. Lett. 76, 1950 (2000).
http://dx.doi.org/10.1063/1.126222
8.
8.E. Kester, U. Rabe, L. Presmanes, Ph. Tailhades, and W. Arnold, J. Phys. Chem. Solids 61, 1275 (2000).
http://dx.doi.org/10.1016/S0022-3697(99)00412-6
9.
9.S. Amelio, A. V. Goldade, U. Rabe, V. Scherer, B. Bhushan, and W. Arnold, Thin Solid Films 392, 75 (2001).
http://dx.doi.org/10.1016/S0040-6090(01)00903-8
10.
10.T. Tsuji and K. Yamanaka, Nanotechnology 12, 301 (2001).
http://dx.doi.org/10.1088/0957-4484/12/3/318
11.
11.U. Rabe, M. Kopycinska, S. Hirsekorn, J. M. Saldana, G. A. Schneider, and W. Arnold, J. Phys. D Appl. Phys. 35, 2621 (2002).
http://dx.doi.org/10.1088/0022-3727/35/20/323
12.
12.A. Striegler, B. Koehler, B. Bendjus, M. Roellig, M. Kopycinska-Mueller, and N. Meyendorf, Ultramicroscopy 111, 1405 (2011).
http://dx.doi.org/10.1016/j.ultramic.2011.05.009
13.
13.F. Dinelli, S. K. Biswas, G. A. D. Briggs, and O. V. Kolosov, Phys. Rev. B 61, 13995 (2000).
http://dx.doi.org/10.1103/PhysRevB.61.13995
14.
14.U. Rabe, S. Amelio, E. Kester, V. Scherer, S. Hirsekorn, and W. Arnold, Ultrasonics 38, 430 (2000).
http://dx.doi.org/10.1016/S0041-624X(99)00207-3
15.
15.D. C. Hurley, M. Kopycinska-Müller, A. B. Kos, and R. H. Geiss, Meas. Sci. Technol. 16, 2167 (2005).
http://dx.doi.org/10.1088/0957-0233/16/11/006
16.
16.M. Kopycinska-Müller, K. B. Yeap, S. Mahajan, B. Köhler, N. Kuzeyeva, T. Müller, E. Zschech, and K. J. Wolter, Nanotechnology 24, 355703 (2013).
http://dx.doi.org/10.1088/0957-4484/24/35/355703
17.
17.K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, and T. Goto, Surf. Interface Anal. 27, 600 (1999).
http://dx.doi.org/10.1002/(SICI)1096-9918(199905/06)27:5/6%3C600::AID-SIA508%3E3.0.CO;2-W
18.
18.M. T. Cuberes, H. E. Assender, G. A. D. Briggs, and O. V. Kolosov, J. Phys. D Appl. Phys. 33, 2347 (2000).
http://dx.doi.org/10.1088/0022-3727/33/19/301
19.
19.U. Rabe, S. Amelio, M. Kopycinska, S. Hirsekorn, M. Kempf, M. Göken, and W. Arnold, Surf. Interface Anal. 33, 65 (2002).
http://dx.doi.org/10.1002/sia.1163
20.
20.U. Rabe, M. Kopycinska, S. Hirsekorn, and W. Arnold, Ultrasonics 40, 49 (2002).
http://dx.doi.org/10.1016/S0041-624X(02)00089-6
21.
21.D. C. Hurley, K. Shen, N. M. Jennett, and J. A. Turner, J. Appl. Phys. 94, 2347 (2003).
http://dx.doi.org/10.1063/1.1592632
22.
22.D. C. Hurley, M. Kopycinska-Müller, and A. B. Kos, JOM 59, 23 (2007).
http://dx.doi.org/10.1007/s11837-007-0005-8
23.
23.I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007).
http://dx.doi.org/10.1063/1.2432410
24.
24.D. Nečas and P. Klapetek, Cent. Eur. J. Phys. 10, 181 (2012).
http://dx.doi.org/10.2478/s11534-011-0096-2
25.
25.J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
http://dx.doi.org/10.1063/1.1143970
26.
26.U. Rabe, K. Janser, and W. Arnold, Rev. Sci. Instrum. 67, 3281 (1996).
http://dx.doi.org/10.1063/1.1147409
27.
27.A. Caron and W. Arnold, Acta Mater. 57, 4353 (2009).
http://dx.doi.org/10.1016/j.actamat.2009.05.030
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/content/aip/journal/adva/5/2/10.1063/1.4908037
2015-02-09
2016-12-04

Abstract

Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.

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