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1.T. Kawahara, R. Takemura, K. Miura, J. Hayakawa, S. Ikeda, Y. M. Lee, R. Sasaki, Y. Goto, K. Ito, T. Meguro, F. Matsukura, H. Takahashi, H. Matsuoka, and H. Ohno, IEEE J. Solid-State Circuits 43, 109 (2008).
2.R. Takemura, T. Kawahara, K. Miura, H. Yamamoto, J. Hayakawa, N. Matsuzaka, K. Ono, M. Yamanouchi, K. Ito, H. Takahashi, S. Ikeda, H. Hasegawa, H. Matsuoka, and H. Ohno, IEEE J. Solid-State Circuits 45, 869 (2010).
3.T. Kawahara, K. Ito, R. Takemura, and H. Ohno, Microelectronics Reliability 52, 613 (2012).
4.K. Yakushiji, T. Saruya, H. Kubota, A. Fukushima, T. Nagahama, S. Yuasa, and K. Ando, Appl. Phys. Lett. 97, 232508 (2010).
5.T. Moriyama, S. Mitani, T. Seki, T. Shima, K. Takanashi, and A. Sakuma, J. Appl. Phys. 95, 6789 (2004).
6.M. Yoshikawa, E. Kitagawa, T. Nagase, T. Daibou, M. Nagamine, K. Nishiyama, T. Kishi, and H. Yoda, IEEE Trans. Magn. 44, 2573 (2008).
7.G. M. Choi, B. C. Min, and K. H. Shin, Appl. Phys. Lett. 97, 202503 (2010).
8.Q. L. Ma, T. Kubota, S. Mizukami, X. M. Zhang, H. Naganuma, M. Oogane, Y. Ando, and T. Miyazaki, Appl. Phys. Lett. 101, 032402 (2012).
9.J. H. Jung, S. H. Lim, and S. R. Lee, J. Nanosci. Nanotechnol. 11, 6233 (2011).
10.S. Ishikawa, H. Sato, M. Yamanouchi, S. Ikeda, S. Fukami, F. Matsukura, and H. Ohno, J. Appl. Phys. 113, 17C721 (2013).
11.M. Gottwald, K. Lee, J. J. Kan, B. Ocker, J. Wrona, S. Tibus, J. Langer, S. H. Kang, and E. E. Fullerton, Appl. Phys. Lett. 102, 052405 (2013).
12.N. Nakajima, T. Koide, T. Shidara, H. Miyauchi, H. Fukutani, A. Fujimori, K. Iio, T. Katayama, M. Nývlt, and Y. Suzuki, Phys. Rev. Lett. 81, 5229 (1998).
13.P. Kamp, A. Marty, B. Gilles, R. Hoffmann, S. Marchesini, M. Belakhovsky, C. Boeglin, H. A. Dürr, S. S. Dhesi, G. van der Laan, and A. Rogalev, Phys. Rev. B 59, 1105 (1999).
14.T. Y. Lee, D. S. Son, S. H. Lim, and S. R. Lee, J. Appl. Phys. 113, 216102 (2013).
15.E. P. Sajitha, J. Walowski, D. Watanabe, S. Mizukami, F. Wu, H. Naganuma, M. Oogane, Y. Ando, and T. Miyazaki, IEEE Trans. Magn. 46, 2056 (2010).
16.G. Hu, T. Topuria, P. M. Rice, Jean Jordan-Sweet, and D. C. Worledge, IEEE Magn. Lett. 4, 3000104 (2013).

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We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd] multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 °C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings.


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