Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
1.C. Ataca, H. Sahin, and S. Ciraci, J. Phys. Chem. C 116, 8983 (2012).
2.V. Nicolosi, M. Chhowalla, M. G. Kanatzidis, M. S. Strano, and J. N. Coleman, Science 340, 1226419 (2013).
3.B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis, Nat. Nanotech. 6, 147 (2011).
4.F. C. Hsu, J. Y. Luo, K. W. Yeh, T. K. Chen, T. W. Huang, P. M. Wu, Y. C. Lee, Y. L. Huang, Y. Y. Chu, D. C. Yan, and M. K. Wu, Proc. Natl. Acad. Sci. 105, 14262 (2008).
5.A. Crepaldi, L. Moreschini, G. Autes, C. Tournier-Colletta, S. Moser, N. Virk, H. Berger, Ph. Bugnon, Y. J. Chang, K. Kern, A. Bostwick, E. Rotenberg, O. V. Yazyev, and M. Grioni, Phys. Rev. Lett. 109, 096803 (2012).
6.Mazhar N. Ali, Jun Xiong, Steven Flynn, Jing Tao, Quinn D. Gibson, Leslie M. Schoop, Tian Liang, Neel Haldolaarachchige, Max Hirschberger, N. P. Ong, and R. J. Cava, Nature 514, 205 (2014).
7.H. Mutka, Phys. Rev. B 28, 2855 (1983).
8.K. Terashima, T. Sato, H. Komatsu, T. Takahashi, N. Maeda, and K. Hayashi, Phys. Rev. B 68, 155108 (2003).
9.L. Perfetti, P. A. Loukakos, M. Lisowski, U. Bovensiepen, H. Berger, S. Biermann, P. S. Cornaglia, A. Georges, and M. Wolf, Phys. Rev. Lett. 97, 067402 (2006).
10.R. H. Friend, D. Jrome, D. M. Schleich, and P. Molini, Solid State Commun. 27, 169 (1978).
11.A. F. Kusmartseva, B. Sipos, H. Berger, L. Forr, and E. Tutis, Phys. Rev. Lett. 103, 236401 (2009).
12.S. Margadonna, Y. Takabayashi, Y. Ohishi, Y. Mizuguchi, Y. Takano, T. Kagayama, T. Nakagawa, M. Takata, and K. Prassides, Phys. Rev. B 80, 064506 (2009).
13.K. Horigane, N. Takeshita, C.-H. Lee, H. Hiraka, and K. Yamada, J. Phys. Soc. Jpn. 78, 063705 (2009).
14.E. Bellingeri, I. Pallecchi, R. Buzio, A. Gerbi, D. marre, M. R. Cimberle, M. Tropeano, M. Putti, A. Palenzona, and C. Ferdehini, Appl. Phys. Lett. 96, 102512 (2010).
15.W. D. Si, Z. W. Lin, Q. Jie, W. G. Yin, J. Zhou, G. D. Gu, P. D. Johnson, and Q. Li, Appl. Phys. Lett. 95, 052504 (2010).
16.Y. Han, W. Y. Li, L. X. Cao, X. Y. Wang, B. Xu, B. R. Zhao, Y. Q. Guo, and J. L. Yang, Phys. Rev. Lett. 104, 017003 (2010).
17.W. K. Wang, J. Li, J. Y. Yang, C. C. Gu, X. L. Chen, Z. T. Zhang, X. B. Zhu, W. J. Lu, H. B. Wang, P. H. Wu, Z. R. Yang, M. L. Tian, Y. H. Zhang, and V. V. Moshchalkov, Appl. Phys. Lett. 105, 232602 (2014).
18.Z. T. Zhang, Z. R. Yang, W. J. Lu, X. L. Chen, L. Li, Y. P. Sun, C. Y. Xi, L. S. Ling, C. J. Zhang, L. Pi, M. L. Tian, and Y. H. Zhang, Phys. Rev. B 88, 214511 (2013).
19.K. Horigane, H. Hiraka, and K. Ohoyama, J. Phys. Soc. Jpn. 78, 074718 (2009).
20.S. Li, Clarina de la Cruz, Q. Huang, Y. Chen, J. W. Lynn, J. Hu, Y. L. Huang, F. C. Hsu, K. W. Yeh, M. K. Wu, and P. Dai, Phys. Rev. B 79, 054503 (2009).
21.W. Bao, Y. Qiu, Q. Huang, M. A. Green, P. Zajdel, M. R. Fitzsimmons, M. Zhernenkov, S. Chang, M. Fang, B. Qian, E. K. Vehstedt, J. Yang, H. M. Pham, L. Spinu, and Z. Q. Mao, Phys. Rev. Lett. 102, 247001 (2009).

Data & Media loading...


Article metrics loading...



We have recently reported that the superconducting transition temperature of FeTeSe flakes attached onto commercial Scotch tape can be enhanced by about 1-2 K due to a thermal-mismatch induced compressive strain. In this work, we further investigated the Scotch tape effect on structural variation of FeTeSe and FeTe flakes by X-ray diffraction measurements. We show that for FeTeSe, the lattice constant of taped flakes is elongated by about 0.5% at 15 K as compared with bulk crystal. Upon warming from 15 K, the lattice constant of the taped flakes first levels off then displays negative thermal expansion followed by monotonic increase at temperatures above 100 K. For antiferromagnetic FeTe, the structural transition around 70 K is remarkably broadened by about 2 K. The present results demonstrate that the Scotch tape is a simple and effective tool to probe structure sensitive physical properties of layered materials.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd