Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
1.N. Ikeda, H. Ohsumi, K. Ohwada, K. Ishii, T. Inami, K. Kakurai, Y. Murakami, K. Yoshii, S. Mori, Y. Horibe, and H. Kito, Nature 436, 1136 (2005).
2.A. Nagano, M. Naka, J. Nasu, and S. Ishihara, Phys. Rev. Lett. 99, 217202 (2007).
3.A. D. Christianson, M. D. Lumsden, M. Angst, Z. Yamani, W. Tian, R. Jin, E. A. Payzant, S. E. Nagler, B. C. Sales, and D. Mandrus, Phys. Rev. Lett. 100, 107601 (2008).
4.J. van den Brink and D. I. Khomskii, J. Phys.: Condens. Matter 20, 434217 (2008).
5.Y. Yamada, K. Kitsuda, S. Nohdo, and N. Ikeda, Phys. Rev. B 62, 12167 (2000).
6.Y. Zhang, H. X. Yang, Y. Q. Guo, C. Ma, H. F. Tian, J. L. Luo, and J. Q. Li, Phys. Rev. B 76, 184105 (2007).
7.Makoto Naka, Aya Nagano, and Sumio Ishihara, Phys. Rev. B 77, 224441 (2008).
8.A. Agui, M. Mizumaki, T. Kuroda, M. Kawai, T. Nagata, N. Ikeda, and T. Uozumi, J. Electron Spectrosc. Relat. Phenom. 197, 13 (2014).
9.I. K. Yang, J. Kim, S. H. Lee, S.-W. Cheong, and Y. H. Jeong, Appl. Phys. Lett. 106, 152902 (2015).
10.S. Patankar, R. J. Choudhary, and D. M. Phase, Appl. Phys. Lett. 106 (2015).
11.Y. Narumi, T. Nakamura, K. Saito, T. Morioka, Y. Fukada, T. Kambe, N. Ikeda, Y. Kotani, T. Kinoshita, K. Kindo, and H. Nojiri, Phys. Rev. B 91 (2015).
12.I. Naoshi, N. Tomoko, K. Jun, and M. Shigeo, J. Phys.: Condens. Matter 27, 053201 (2015).
13.S. M. Gaw, H. J. Lewtas, D. F. McMorrow, J. Kulda, R. A. Ewings, T. G. Perring, R. A. McKinnon, G. Balakrishnan, D. Prabhakaran, and A. T. Boothroyd, Phys. Rev. B 91 (2015).
14.I. N. Apostolova, A. T. Apostolov, S. G. Bahoosh, S. Trimper, and J. M. Wesselinowa, Phys. Lett. A 379, 743 (2015).
15.Y. Matsui, J. Appl. Cryst. 13, 395 (1980).
16.S. Lafuerza, J. Garcia, G. Subias, J. Blasco, and V. Cuartero, Phys. Rev. B 89, 045129 (2014).
17.Y. Nakagawa, M. Inazumi, N. Kimizuka, and K. Siratori, J. Phys. Soc. Jpn. 47, 1369 (1979).
18.M. Inazumi, Y. Nakagawa, M. Tanaka, N. Kimizuka, and K. Shiratori, J. Phys. Soc. Jpn 50, 438 (1981).
19.M. Tanaka, J. Akimitsu, Y. Inada, N. Kimizuka, I. Shindo, and K. Siratori, Solid State Commun. 44, 687 (1982).
20.S. Mori, S. Shinohara, Y. Matsuo, Y. Horibe, K. Yoshii, and N. Ikeda, Jpn. J. of Appl. Phys. 47, 7595 (2008).
21.Y. Horibe, K. Kishimoto, S. Mori, and N. Ikeda, Integr. Ferroelectrics 67, 151 (2004).
22.F. Wang, J. Kim, G. D. Gu, Y. Lee, S. Bae, and Y.-J. Kim, J. Appl. Phys. 113 (2013).
23.M. Hervieu, A. Guesdon, J. Bourgeois, E. Elkaim, M. Poienar, F. Damay, J. Rouquette, A. Maignan, and C. Martin, Nat. Mater. 13, 74 (2014).
24.M. Isobe, N. Kimizuka, J. Iida, and S. Takekawa, Acta Cryst. C 46, 1917 (1990).
25.C. M. Brooks, R. Misra, J. A. Mundy, L. A. Zhang, B. S. Holinsworth, K. R. O’Neal, T. Heeg, W. Zander, J. Schubert, J. L. Musfeldt, Z.-K. Liu, D. A. Muller, P. Schiffer, and D. G. Schlom, Appl. Phys. Lett. 101, 132907 (2012).
26.W. Wang, Z. Gai, M. Chi, J. D. Fowlkes, J. Yi, L. Zhu, X. Cheng, D. J. Keavney, P. C. Snijders, T. Z. Ward, J. Shen, and Xiaoshan Xu, Phys. Rev. B 85, 155411 (2012).
27.H. J. Xiang and M. H. Whangbo, Phys. Rev. Lett. 98, 246403 (2007).
28.K. Kuepper, M. Raekers, C. Taubitz, M. Prinz, C. Derks, M. Neumann, A. V. Postnikov, F. M. F. de Groot, C. Piamonteze, D. Prabhakaran, and S. J. Blundell, Phys. Rev. B 80, 220409 (2009).
29.R. C. Rai, A. Delmont, A. Sprow, B. Cai, and M. L. Nakarmi, Appl. Phys. Lett. 100, 212904 (2012).
30.J. Akimitsu, Y. Inada, K. Siratori, I. Shindo, and N. Kimizuka, Solid State Commun. 32, 1065 (1979).
31.B. Cai, M. L. Nakarmi, B. S. Franks, and R. C. Rai, Thin Solid Films 562, 492 (2014).

Data & Media loading...


Article metrics loading...



We report structural, optical, and electro-optical properties of polycrystalline YFeOthin films,deposited on (0001) sapphire substrates using the electron-beam deposition technique. The optical spectra of a 120 nm YFeO show Fe to on-site and O 2 to Fe 3, Y 4, and Y 5charge-transfer electronic excitations. Anomalies in the temperature dependence data of the charge-transfer excitations and the splitting of the 4.46 eV charge-transfer peak strongly suggest a structural distortion at 180 ± 10 K. Evidence of such a structural distortion is also manifested in the surface resistance versus temperature data. In addition, the YFeOthin film at low temperatures shows strong electro-optical properties, as high as 9% in the energy range of 1 - 2.5 eV, for applied electric fields up to 500−1.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd