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1.
1.F. Greuter and G. Blatter, Semicond. Sci. Tech 5, 111 (1990).
http://dx.doi.org/10.1088/0268-1242/5/2/001
2.
2.Y. Sato, J. P. Buban, T. Mizoguchi, N. Shibata, M. Yodogawa, T. Yamamoto, and Y. Ikuhara, Phys. Rev. Lett. 97, 106802 (2006).
http://dx.doi.org/10.1103/PhysRevLett.97.106802
3.
3.Ü. Özgür, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doğan, V. Avrutin, S.-J. Cho, and H. Morkoç, J. Appl. Phys. 98, 041301 (2005).
http://dx.doi.org/10.1063/1.1992666
4.
4.T. K. Gupta, J. Am. Ceram. Soc. 73, 1817 (1990).
http://dx.doi.org/10.1111/j.1151-2916.1990.tb05232.x
5.
5.D. R. Clarke, J. Am. Ceram. Soc. 82, 485 (1999).
http://dx.doi.org/10.1111/j.1151-2916.1999.tb01793.x
6.
6.C. Cheng, J. He, and J. Hu, Appl. Phys. Lett. 105, 133508 (2014).
http://dx.doi.org/10.1063/1.4897152
7.
7.J. He, J. Liu, J. Hu, and W. Long, Mater. Lett. 65, 2595 (2011).
http://dx.doi.org/10.1016/j.matlet.2011.06.022
8.
8.J. Hu, J. He, W. Long, and J. Liu, J. Am. Ceram. Soc. 93, 2155 (2010).
http://dx.doi.org/10.1111/j.1551-2916.2010.03692.x
9.
9.J. He, W. Long, J. Hu, and J Liu, J. Ceram. Soc. Jpn. 119, 43 (2011).
http://dx.doi.org/10.2109/jcersj2.119.43
10.
10.W. Long, J. Hu, J. Liu, J. He, and R. Zong, J. Am. Ceram. Soc. 93, 2441 (2010).
http://dx.doi.org/10.1111/j.1551-2916.2010.03787.x
11.
11.W. Long, J. Hu, J. Liu, and J. He, Mater. Lett. 64, 1081 (2010).
http://dx.doi.org/10.1016/j.matlet.2010.02.019
12.
12.M. A. Ramírez, R. Tararam, A.Z. Simões, A. Ries, E. Longo, and J. A. Varela, J. Am. Ceram. Soc. 96, 1801 (2013).
http://dx.doi.org/10.1111/jace.12241
13.
13.T. Tada, Electr. Eng. Jpn. 170, 1 (2010).
http://dx.doi.org/10.1002/eej.20934
14.
14.J. Liu, Ph.D. Thesis, Tsinghua University, 2011.
15.
15.T. K. Gupta and W. G. Carlson, J. Mater. Sci. 20, 3487 (1985).
http://dx.doi.org/10.1007/BF01113755
16.
16.K. Eda, A. Iga, and M. Matsuoka, J. Appl. Phys. 51, 2678 (1980).
http://dx.doi.org/10.1063/1.327927
17.
17.K. Eda, J. Appl. Phys. 49, 2964 (1978).
http://dx.doi.org/10.1063/1.325139
18.
18.K. Eda and M. Matsuoka, Jpn. J. Appl. Phys. 16, 195 (1977).
http://dx.doi.org/10.1143/JJAP.16.195
19.
19.K. Takahashia, T. Miyoshia, K. Maedaa, T. Yamazakia, and S. Ohwadaa, in MRS Proceedings (Cambridge University Press, 1981), Vol.5, p. 399.
http://dx.doi.org/10.1557/PROC-5-399
20.
20.Y. Chiang, W. D. Kingery, and L. M. Levinson, J. Appl. Phys. 53, 1765 (1982).
http://dx.doi.org/10.1063/1.331647
21.
21.K. Sato, Y. Takada, T. Takemura, and M. Ototake, J. Appl. Phys. 53, 8819 (1982).
http://dx.doi.org/10.1063/1.330433
22.
22.K. Sato, Y. Takada, H. Maekawa, M. Ototake, and S. Tominaga, Jpn. J. Appl. Phys. 19, 909 (1980).
http://dx.doi.org/10.1143/JJAP.19.909
23.
23.E. Sonder, L.M. Levinson, and W. Katz, J. Appl. Phys 58, 4420 (1985).
http://dx.doi.org/10.1063/1.335533
24.
24.A. Bui, A. Loubiere, and M. Hassanzadeh, J. Appl. Phys. 65, 4048 (1989).
http://dx.doi.org/10.1063/1.343330
25.
25.M. A. Ramírez, A. Z. Simões, P. R. Bueno, M. A. Márquez, M. O. Orlandi, and J. A. Varela, J. Mater. Sci. 41, 6221 (2006).
http://dx.doi.org/10.1007/s10853-006-0589-3
26.
26.J. He, J. Liu, J. Hu, R. Zeng, and W. Long, J. Eur. Ceram. Soc. 31, 1451 (2011).
http://dx.doi.org/10.1016/j.jeurceramsoc.2011.01.024
27.
27.D. J. Binks and R. W. Grimes, J. Am. Ceram. Soc. 76, 2370 (1993).
http://dx.doi.org/10.1111/j.1151-2916.1993.tb07779.x
28.
28.K. Eda, IEEE Electr. Insul. M. 5, 28 (1989).
http://dx.doi.org/10.1109/57.44606
29.
29.J. Liu, J. He, J. Hu, W. Long, and F. Luo, Mater. Chem. Phys. 125, 9 (2011).
http://dx.doi.org/10.1016/j.matchemphys.2010.09.023
30.
30.J. Liu, J. He, J. Hu, W. Long, and R. Zeng, J. Am. Ceram. Soc. 93, 2473 (2010).
http://dx.doi.org/10.1111/j.1551-2916.2010.03834.x
31.
31.C. Cheng, J. He, and J. Hu, Appl. Phys. Lett. 101, 173508 (2012).
http://dx.doi.org/10.1063/1.4764551
32.
32.Y. Sato, T. Yamamoto, and Y. Ikuhara, J. Am. Ceram. Soc. 90, 337 (2007).
http://dx.doi.org/10.1111/j.1551-2916.2006.01481.x
33.
33.G. Blatter and F. Greuter, Phys. Rev. B 33, 3952 (1986).
http://dx.doi.org/10.1103/PhysRevB.33.3952
34.
34.M. Matsuoka, Jpn. J. Appl. Phys. 10, 736 (1971).
http://dx.doi.org/10.1143/JJAP.10.736
35.
35.G. E. Pike, in MRS Proceedings, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A, January 1981 (Cambridge University Press), pp. 369-379.
36.
36.G. Blatter and F. Greuter, Phys. Rev. B 34, 8555 (1986).
http://dx.doi.org/10.1103/PhysRevB.34.8555
37.
37.K. O. Magnusson and S. Wiklund, J. Appl. Phys. 76, 7405 (1994).
http://dx.doi.org/10.1063/1.357966
38.
38.J. P. Gambino, W. D. Kingery, G. E. Pike, H. R. Philipp, and L. M. Levinson, J. Appl. Phys. 61, 2571 (1987).
http://dx.doi.org/10.1063/1.337934
39.
39.P. L. Hower and T. K. Gupta, J. Appl. Phys. 50, 4847 (1979).
http://dx.doi.org/10.1063/1.326549
40.
40.P. R. Bueno, E. R. Leite, M. M. Oliveira, M. O. Orlandi, and E. Longo, Appl. Phys. Lett. 79, 48 (2001).
http://dx.doi.org/10.1063/1.1378051
41.
41.F. Stucki and F. Greuter, Appl. Phys. Lett. 57, 446 (1990).
http://dx.doi.org/10.1063/1.103661
42.
42.F. Oba, H. Adachi, and I. Tanaka, J. Mater. Res. 15, 2167 (2000).
http://dx.doi.org/10.1557/JMR.2000.0312
43.
43.J. M. Carlsson, H. S. Domingos, P. D. Bristowe, and B. Hellsing, Phys. Rev. Lett. 91, 165506 (2003).
http://dx.doi.org/10.1103/PhysRevLett.91.165506
44.
44.J. M. Carlsson, B. Hellsing, H. S. Domingos, and P. D. Bristowe, Surf. Sci. 532–535, 351 (2003).
http://dx.doi.org/10.1016/S0039-6028(03)00193-6
45.
45.H. S. Domingos, J. M. Carlsson, P. D. Bristowe, and B. Hellsing, Interface Sci. 12, 227 (2004).
http://dx.doi.org/10.1023/B:INTS.0000028652.75962.10
46.
46.H. S. Domingos, J. Phys.: Condens. Matter 22, 145503 (2010).
http://dx.doi.org/10.1088/0953-8984/22/14/145503
47.
47.C. Freysoldt, B. Grabowski, T. Hickel, J. Neugebauer, G. Kresse, A. Janotti, and C. G. Van de Walle, Rev. Mod. Phys. 86, 253 (2014).
http://dx.doi.org/10.1103/RevModPhys.86.253
48.
48.C. Zhixiong, L. Guocong, F. Gang, and T. Dahai, Sci. China Ser. A 41, 71 (1998).
http://dx.doi.org/10.1007/BF02900775
49.
49.H. Kawamura and M. Nawata, in 11th International Symposium on High-Voltage Engineering (ISH 99) (1999), Vol.2, pp. 325-328.
50.
50.Y. Li, M. Yasuda, and T. Takada, IEEE T. Dielect. El. In. 1, 188 (1994).
http://dx.doi.org/10.1109/94.300251
51.
51.J. B. Bernstein, Phys. Rev. B 44, 10804 (1991).
http://dx.doi.org/10.1103/PhysRevB.44.10804
52.
52.P. Morshuis and M. Jeroense, IEEE Electr. Insul. M. 13, 26 (1997).
http://dx.doi.org/10.1109/57.591529
53.
53.J. B. Bernstein, Ph.D. Thesis, Massachusetts Institute of Technology, 1990.
54.
54.J. B. Bernstein, IEEE T. Dielect. El. In. 27, 152 (1992).
55.
55.X. Zhao, J. Li, H. Li, and S. Li, J. Appl. Phys. 111, 124106 (2012).
http://dx.doi.org/10.1063/1.4729804
56.
56.D. C. Look, G. C. Farlow, P. Reunchan, S. Limpijumnong, S. B. Zhang, and K. Nordlund, Phys. Rev. Lett. 95, 225502 (2005).
http://dx.doi.org/10.1103/PhysRevLett.95.225502
57.
57.D. C. Look, J. W. Hemsky, and J.R. Sizelove, Phys. Rev. Lett. 82, 2552 (1999).
http://dx.doi.org/10.1103/PhysRevLett.82.2552
58.
58.K. R. Kittilstved, D. A. Schwartz, A. C. Tuan, S. M. Heald, S. A. Chambers, and D. R. Gamelin, Phys. Rev. Lett. 97, 037203 (2006).
http://dx.doi.org/10.1103/PhysRevLett.97.037203
59.
59.J. Han, A. M. R. Senos, and P. Q. Mantas, Mater. Chem. Phys. 75, 117 (2002).
http://dx.doi.org/10.1016/S0254-0584(02)00063-9
60.
60.P. Cheng, S. Li, L. Zhang, and J. Li, Appl. Phys. Lett. 93, 012902 (2008).
http://dx.doi.org/10.1063/1.2956405
61.
61.C. Cheng, J. Hu, and J. He, Mater. Lett. 132, 240 (2014).
http://dx.doi.org/10.1016/j.matlet.2014.06.100
62.
62.W. J. Yin, J. Ma, S. H. Wei, M. M. Al-Jassim, and Y. Yan, Phys. Rev. B 86, 045211 (2012).
http://dx.doi.org/10.1103/PhysRevB.86.045211
63.
63.A. Alkauskas and A. Pasquarello, Phys. Rev. B 84, 125206 (2011).
http://dx.doi.org/10.1103/PhysRevB.84.125206
64.
64.R. Vidya, P. Ravindran, H. Fjellvåg, B. G. Svensson, E. Monakhov, M. Ganchenkova, and R. M. Nieminen, Phys. Rev. B 83, 045206 (2011).
http://dx.doi.org/10.1103/PhysRevB.83.045206
65.
65.S. J. Clark, J. Robertson, S. Lany, and A. Zunger, Phys. Rev. B 81, 115311 (2010).
http://dx.doi.org/10.1103/PhysRevB.81.115311
66.
66.F. Oba, A. Togo, I. Tanaka, J. Paier, and G. Kresse, Phys. Rev. B 77, 245202 (2008).
http://dx.doi.org/10.1103/PhysRevB.77.245202
67.
67.T. R. Paudel and W. R. L. Lambrecht, Phys. Rev. B 77, 205202 (2008).
http://dx.doi.org/10.1103/PhysRevB.77.205202
68.
68.S. Lany and A. Zunger, Phys. Rev. Lett. 98, 045501 (2007).
http://dx.doi.org/10.1103/PhysRevLett.98.045501
69.
69.A. Janotti and C. G. Van de Walle, Phys. Rev. B 76, 165202 (2007).
http://dx.doi.org/10.1103/PhysRevB.76.165202
70.
70.P. Erhart, K. Albe, and A. Klein, Phys. Rev. B 73, 205203 (2006).
http://dx.doi.org/10.1103/PhysRevB.73.205203
71.
71.P. Erhart, A. Klein, and K. Albe, Phys. Rev. B 72, 085213 (2005).
http://dx.doi.org/10.1103/PhysRevB.72.085213
72.
72.A. Janotti and C. G. Van de Walle, Appl. Phy. Lett. 87, 122102 (2005).
http://dx.doi.org/10.1063/1.2053360
73.
73.S. B. Zhang, S.H. Wei, and A. Zunger, Phys. Rev. B 63, 075205 (2001).
http://dx.doi.org/10.1103/PhysRevB.63.075205
74.
74.A. F. Kohan, G. Ceder, D. Morgan, and C. G. Van de Walle, Phys. Rev. B 61, 15019 (2000).
http://dx.doi.org/10.1103/PhysRevB.61.15019
75.
75.Y. F. Yan and M. M. Al-Jassim, Phys. Rev. B 69, 085204 (2004).
http://dx.doi.org/10.1103/PhysRevB.69.085204
76.
76.Y. S. Kim and C. H. Park, Phys. Rev. Lett. 102, 086403 (2009).
http://dx.doi.org/10.1103/PhysRevLett.102.086403
77.
77.K. Mukae, K. Tsuda, and I. Nagasawa, J. Appl. Phys. 50, 4475 (1979).
http://dx.doi.org/10.1063/1.326411
78.
78.J. He, C. Cheng, and J. Hu, Scripta Mater. 104, 25 (2015).
http://dx.doi.org/10.1016/j.scriptamat.2015.03.019
79.
79.C. Skylaris, P. D. Haynes, A. A. Mostofi, and M. C. Payne, J. Chem. Phys. 122, 084119 (2005).
http://dx.doi.org/10.1063/1.1839852
80.
80.H. S. Domingos, J. M. Carlsson, P. D. Bristowe, and B. Hellsing, J Phys.: Condens. Matter 14, 12717 (2002).
http://dx.doi.org/10.1088/0953-8984/14/48/308
81.
81.J. M. Carlsson, B. Hellsing, H. S. Domingos, and P. D. Bristowe, Phys. Rev. B 65, 205122 (2002).
http://dx.doi.org/10.1103/PhysRevB.65.205122
82.
82.M. Takada, Y. Sato, and S. Yoshikado, J. Am. Ceram. Soc. 95, 2579 (2012).
http://dx.doi.org/10.1111/j.1551-2916.2012.05212.x
83.
83.A. Walsh, G. W. Watson, D. J. Payne, R. G. Edgell, J. Guo, P. Glans, T. Learmonth, and K. E. Smith, Phys. Rev. B 73, 235104 (2006).
http://dx.doi.org/10.1103/PhysRevB.73.235104
84.
84.T. K. Gupta and A. C. Miller, J. Mater. Res. 3, 745 (1988).
http://dx.doi.org/10.1557/JMR.1988.0745
85.
85.M. Takada and S. Yoshikado, Key Engineering Materials (Trans Tech Publ, Edited2007), Vol. 350, pp. 213-216.
http://aip.metastore.ingenta.com/content/aip/journal/adva/6/3/10.1063/1.4944485
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/content/aip/journal/adva/6/3/10.1063/1.4944485
2016-03-14
2016-12-06

Abstract

Researches on electrical degradation of double-Schottky barrier in ZnOvaristors are reviewed, aimed at the constitution of a full picture of universal degradation mechanism within the perspective of defect. Recent advances in study of ZnOmaterials by atomic-scale calculations are partly included and discussed, which brings to our attention distinct cognition on the native point defects and their profound impact on degradation.

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