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Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component
9.Z. Li, X. Li, D. Dong, D. Liu, H. Saito, and S. Ishio, Sci. Rep. 4, 1 (2014).
See supplementary material at http://dx.doi.org/10.1063/1.4944951
for the peak-to-peak amplitudes ofθx
as a function of the head current from 0 to 20 mA, and for the Kerr hysteresis loops of the magnetic tip as a function of the head current in the external magnetic field of 5 to 25 Oe, the time dependence of the lock-in amplifier output of the NiFe(100 nm)/Si when applying the DC magnetic field perpendicular to the spin-sensitive direction, and the time dependence of the lock-in amplifier output of a nonmagnetic oxidized stainless steel sample when applying the DC magnetic field parallel to the spin-sensitive direction.[Supplementary Material]
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We developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough surface of a polycrystalline NiFe film. The spin asymmetry of the NiFe film was about 1.3% within the bias voltage range of -3 to 1 V. We obtained the local spin component image of the sample surface, switching the magnetic field of the sample to reverse the sample magnetization during scanning. We also obtained a spin image of the rough surface of a polycrystalline NiFe film evaporated on the recording medium of a hard disk drive.
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