Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/adva/6/5/10.1063/1.4942956
1.
1.C. W. Nan, M. I. Bichurin, S. X. Dong, D. Viehland, and G. Srinivasan, J. Appl. Phys. 103, 031101 (2008).
http://dx.doi.org/10.1063/1.2836410
2.
2.S. Priya, R. Islam, S. X. Dong, and D. Viehland, J. Electroceram. 19, 149 (2007).
http://dx.doi.org/10.1007/s10832-007-9042-5
3.
3.J. T. Zhang, P. Li, Y. M. Wen, W. He, A. C. Yang, and C. J. Lu, Appl.Phys. Lett. 103, 201902 (2013).
http://dx.doi.org/10.1063/1.4829858
4.
4.D. T. Huong Giang and N. H. Duc, Sens. Actuators A 149, 229 (2009).
http://dx.doi.org/10.1016/j.sna.2008.12.003
5.
5.P. Li, Y. M. Wen, and L. X. Bian, Appl. Phys. Lett. 90, 022503 (2007).
http://dx.doi.org/10.1063/1.2431469
6.
6.L. Chen, P. Li, Y. M. Wen, and J. Qiu, J. Appl. Phys. 111, 07E503 (2012).
7.
7.N. H. Duc and D. T. Huong Giang, J. Alloys Compd. 449, 214 (2008).
http://dx.doi.org/10.1016/j.jallcom.2006.01.121
8.
8.S. X. Dong, J. F. Li, and D. Viehland, Appl. Phys. Lett. 83, 2265 (2003).
http://dx.doi.org/10.1063/1.1611276
9.
9.S. X. Dong, J. Zhai, F. Bai, J. F. Li, D. Viehland, and T. A. Lograsso, J.Appl. Phys. 97, 103902 (2005).
http://dx.doi.org/10.1063/1.1899247
10.
10.S. X. Dong, J. F. Li, and D. Viehland, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 50, 1253 (2003);
http://dx.doi.org/10.1109/TUFFC.2003.1244741
10.S. X. Dong, J. F. Li, and D. Viehland, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 51, 794 (2004).
http://dx.doi.org/10.1109/TUFFC.2004.1320738
11.
11.L. Chen, P. Li, Y.M. Wen, and Y. Zhu, J. Alloys Comp. 555, 156 (2013).
http://dx.doi.org/10.1016/j.jallcom.2012.12.007
12.
12.S. K. Mandal, G. Sreenivasulu, V.M. Petrov, and G. Srinivasan, Appl. Phys. Lett. 96, 192502 (2010).
http://dx.doi.org/10.1063/1.3428774
http://aip.metastore.ingenta.com/content/aip/journal/adva/6/5/10.1063/1.4942956
Loading
/content/aip/journal/adva/6/5/10.1063/1.4942956
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/adva/6/5/10.1063/1.4942956
2016-02-23
2016-09-30

Abstract

Magnetoelectric(ME) coupling characteristics in multiferroicheterostructures with different thickness of nanocrystalline soft magnetic alloy has been investigated at low frequency. The ME response with obvious hysteresis, self-biased and dual-peak phenomenon is observed for multiferroicheterostructures, which results from strong magnetic interactions between two ferromagnetic materials with different magnetic properties, magnetostrictions and optimum bias magnetic fields. The proposed multiferroicheterostructures not only enhance ME coupling significantly, but also broaden dc magnetic bias operating range and overcomes the limitations of narrow bias range. By optimizing the thickness of nanocrystalline soft magnetic alloy T, a significantly zero-biased ME voltage coefficient(MEVC) of 14.8mV/Oe (185 mV/cm⋅ Oe) at T = 0.09 mm can be obtained, which is about 10.8 times as large as that of traditional PZT/Terfenol-D composite with a weak ME coupling at zero bias . Furthermore, when T increases from 0.03 mm to 0.18 mm, the maximum MEVC increases nearly linearly with the increased T at . Additionally, the experimental results demonstrate the ME response for multiferroicheterostructures spreads over a wide magnetic dc bias operating range. The excellent ME performance provides a promising and practicable application for both highly sensitive magnetic field sensors without bias and ME energy harvesters.

Loading

Full text loading...

/deliver/fulltext/aip/journal/adva/6/5/1.4942956.html;jsessionid=ewPxeDGg0_9SHPGIdg24pB52.x-aip-live-03?itemId=/content/aip/journal/adva/6/5/10.1063/1.4942956&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/adva
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=aipadvances.aip.org/6/5/10.1063/1.4942956&pageURL=http://scitation.aip.org/content/aip/journal/adva/6/5/10.1063/1.4942956'
Right1,Right2,Right3,