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/content/aip/journal/adva/6/5/10.1063/1.4943236
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/content/aip/journal/adva/6/5/10.1063/1.4943236
2016-03-01
2016-12-05

Abstract

(001) textured FeNthin film with Ag under layer is successfully grown on GaAs substrate using a facing target sputtering (FTS) system. After post annealing, chemically ordered FeN phase is formed and detected by X-ray diffraction(XRD). High saturation magnetization (Ms) is measured by a vibrating sample magnetometer (VSM). In comparison with FeN with Ag under layer on MgO substrate and FeN with Fe under layer on GaAs substrate, the current layer structure shows a higher Ms value, with a magnetically softer feature in contrast to the above cases. In addition, X-ray photoelectron spectroscopy(XPS) is performed to characterize the binding energy of N atoms. To verify the role of strain that the FeN layer experiences in the above three structures,Grazing Incidence X-ray Diffraction (GIXRD) is conducted to reveal a large in-plane lattice constant due to the in-plane biaxial tensile strain.

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/deliver/fulltext/aip/journal/adva/6/5/1.4943236.html;jsessionid=8w9ZbT_rLvM7R33GGrna9nvl.x-aip-live-03?itemId=/content/aip/journal/adva/6/5/10.1063/1.4943236&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/adva
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=aipadvances.aip.org/6/5/10.1063/1.4943236&pageURL=http://scitation.aip.org/content/aip/journal/adva/6/5/10.1063/1.4943236'
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