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1.O. A. Ivanov, L. V. Solina, V. A. Demshina, and L. M. Magat, Phys. Met. Metallogr. 35, 81 (1973).
2.H. Kanazawa, G. Lauhoff, and T. Suzuki, J. Appl. Phys. 87, 6143 (2000).
3.D. Weller, A. Moser, L. Folks, M. E. Best, M. F. Toney, M. Schwickert, J.-U. Thiele, and M. F. Doerner, IEEE Trans. Magn. 36, 10 (2000).
4.J. B. Staunton, S. Ostanin, S. S. a Razee, B. Gyorffy, L. Szunyogh, B. Ginatempo, and E. Bruno, J. Phys.: Condens. Matter. 16, S5623 (2004).
5.Y. Kota and A. Sakuma, J. Phys. Soc. Jpn. 81, 084705 (2012).
6.S. Okamoto, N. Kikuchi, O. Kitakami, T. Miyazaki, Y. Shimada, and K. Fukamichi, Phys. Rev. B 66, 024413 (2002).
7.A. Hotta, T. Ono, M. Hatayama, K. Tsumura, N. Kikuchi, S. Okamoto, O. Kitakami, and T. Shimatsu, J. Appl. Phys. 115, 17B712 (2014).
8.T. Seki, T. Shima, K. Takanashi, Y. Takahashi, E. Matsubara, and K. Hono, Appl. Phys. Lett. 82, 2461 (2003).
9.K. Barmak, J. Kim, L. H. Lewis, K. R. Coffey, M. F. Toney, a. J. Kellock, and J.-U. Thiele, J. Appl. Phys. 98, 033904 (2005).
10.A. Hotta, T. Ono, N. Kikuchi, S. Okamoto, O. Kitakami, and T. Shimatsu, 13th Joint MMM-Intermag Conference, FV-05 (2016).
11.T. Maeda, T. Kai, A. Kikitsu, T. Nagase, and J. Akiyama, Appl. Phys. Lett. 80 2147 (2002).
12.D. C. Berry and K. Barmak, J. Appl. Phys. 102, 024912 (2007).
13.B. Wang and K. Barmak, J. Appl. Phys. 109, 123916 (2011).
14.J. Ikemoto, Y. Imai, and S. Nakagawa, IEEE Trans. Magn. 44, 3543 (2008).
15.D. A. Gilbert, L.-W. Wang, T. J. Klemmer, J.-U. Thiele, C.-H. Lai, and K. Liu, Appl. Phys. Lett. 102, 132406 (2013).
16.B. M. H. Kryder, E. C. Gage, T. W. Mcdaniel, W. A. Challener, R. E. Rottmayer, G. Ju, Y. Hsia, and M. F. Erden, Proc. IEEE 96, 1810 (2008).
17.G. Ju, Y. Peng, E. K. C. Chang, Y. Ding, A. Q. Wu, X. Zhu, Y. Kubota, T. J. Klemmer, H. Amini, L. Gao, Z. Fan, T. Rausch, P. Subedi, M. Ma, S. Kalarickal, C. J. Rea, D. V. Dimitrov, P.-W. Huang, K. Wang, X. Chen, C. Peng, J. W. Dykes, M. A. Seigler, E. C. Gage, R. Chantrell, and J.-U. Thiele, IEEE Trans. Magn. 51, 3201709 (2015).
18.I. L. Prejbeanu, M. Kerekes, R. C. Sousa, H. Sibuet, O. Redon, B. Dieny, and J. P. Nozires, J. Phys.: Condens. Matter. 19, 165218 (2007).
19.J. C. A. Huang, Y. C. Chang, C. C. Yu, Y. D. Yao, Y. M. Hu, and C. M. Fu, J. Appl. Phys. 93, 8173 (2003).
20.G. Meyer and J.-U. Thiele, Phys. Rev. B 73, 214438 (2006).
21.D. B. Xu, J. S. Chen, T. J. Zhou, and G. M. Chow, J. Appl. Phys. 109, 2009 (2011).
22.J.-U. Thiele, K. R. Coffey, M. F. Toney, J. A. Hedstrom, and A. J. Kellock, J. Appl. Phys. 91, 6595 (2002).
23.M. L. Yan, Y. F. Xu, X. Z. Li, and D. J. Sellmyer, J. Appl. Phys. 97, 10H309 (2005).
24.T. Kai, T. Maeda, A. Kikitsu, J. Akiyama, T. Nagase, and T. Kishi, J. Appl. Phys. 95, 609 (2004).
25.T. Moriya, H. Nakata, K. Komiyama, S. Okamoto, N. Kikuchi, O. Kitakami, and T. Shimatsu, 58th Conference on Magn. Magn. Mater. (MMM), BT-05 (2013).
26.T. Suzuki, H. Kanazawa, and A. Sakuma, IEEE Trans. Magn. 38, 2794 (2002).
27.C. J. Aas, L. Szunyogh, and R. W. Chantrell, EPL (Europhysics Lett.) 102, 57004 (2013).
28.Y. Kota and A. Sakuma, J. Phys. Soc. Jpn. 83, 034715 (2014).
29.A. Sakuma, J. Phys. Soc. Jpn. 63, 3053 (1994).
30.R. Cuadrado, T. J. Klemmer, and R. W. Chantrell, Appl. Phys. Lett. 105, 152406 (2014).

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In 1 (fct)-FePt thin films, both tuning Fe and Pt concentrations and substitution with third-metal were studied for magnetic characteristic optimization. We investigated single-crystalline FePt- ( = Mn, Ni, Cu) thin films grown epitaxially on MgO(001) substrates at a substrate temperature of 350  °C by changing Fe, Pt, and contents, and explored the effects of off-stoichiometry and 3-metal-substitution. The magnetic moment per atom () of FePt-films as a function of the effective number of valence electrons () in 3metal sites follows the Slater-Pauling-type trend, by which decreases by the deviation from = 8, independently of the metal and the Pt concentration. The magnetic anisotropy () exhibits dependence similar to . This trend was almost independent of the Pt concentration after compensation using the theoretical prediction on the relation between and Fe/Pt concentrations. Such a trend has been proved for stoichiometric FePt-films, but it was clarified as robust against off-stoichiometry. The compensated () of FePt-Mn and FePt-Cu followed a similar trend to that predicted by the rigid-band model, although the of the FePt-Mn thin films dropped more rapidly than the rigid band calculation. However, it followed the recent first-principles calculation.


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