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Temperature dependence of FMR and magnetization in nanocrystalline zinc ferrite thin films
1.M. Bohra, Shiva Prasad, Naresh Kumar, D. S. Misra, S. C. Sahoo, N. Venkataramani, and R. Krishnan, Appl. Phys. Lett. 88(2506), (2006).
2.M. Sultan and R. Singh, J. Appl. Phys. 105, 07A512 (2009).
3.Dangwei Guo, Jingyi Zhu, Yuancai Yang, Xiaolong Fan, Guozhi Chai, Wenbo Sui, Zhengmei Zhang, and Desheng Xue, J. Appl. Phys. 107, 043903 (2010).
11.J. Dash, Shiva Prasad, N. Venkataramani, R. Krishnan, Pran Kishan, Nitendar Kumar, S. D. Kulkarni, and S. K. Date, J. Appl. Phys. 86, 3303-3311 (1999).
15.F Keffer, Handbuch der Physik (Springer-Verlag, Berlin, 1966), Vol. 18, p. 130.
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Single phase nano-crystalline zinc ferritethin films were deposited by RF-magnetron sputtering on quartz substrate at room temperature (RT) in pure Argon environment and annealed (in air) at different temperatures.Temperature dependence of magnetization was studied on these films using both VSM and by observing FMR (in X band). Value of exchange stiffness constant (D) was obtained by fitting Bloch’s law to the low temperature magnetization data. The value of D decreased monotonously with the annealingtemperature (TA) of the samples. A filmannealed at TA = 523 K, exhibited the highest magnetization value. The FMR line width of the films decreased with increase in measurementtemperature. At RT (∼293 K), the lowest value of line width (ΔH) was 15 kA/m and 13 kA/m in parallel and perpendicular configuration respectively for the sample annealed at TA = 623 K.
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