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Three kinds of 2,5,-diphenyl-dithienol[2, 3-: 3′, 2′-]thiophene (DP-DTT), 2,5,-distyryl-dithienol[2, 3-: 3′, 2′-]thiophene (DEP-DTT) and 2,5,-thienyl-dithienol[2, 3-: 3′, 2′-]thiophene (DET-DTT) micro-region structure and electronic properties were studied. Thin films of these functionalized DTT oligomers were prepared in a one-step drop-casting deposition onto highly oriented pyrolytic graphite substrates. The surface structure of these films was characterized by atomic force microscopy (AFM). Conducting probe atomic force microscope (C-AFM) and Kelvin probe force microscope (KFM) were both used to characterize the electronic transport behavior and surface potential distribution. The substituents of DTT oligomers can greatly affect their aggregation and the hopping conductance mechanism was used to explain the Au-DTTs-HOPG junctions. KFM investigation revealed that these oligomers with different substituents have different highest occupied molecular orbital energy levels. The corresponding theoretical analysis reveals similar result to KFM characterization. The - results indicated that the aggregates of molecules were the dominating factor to their micro-region electrical transport.


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