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/content/aip/journal/adva/6/9/10.1063/1.4963077
1.
J. M. Meek, Phys. Rev. 57, 722 (1940).
http://dx.doi.org/10.1103/PhysRev.57.722
2.
G. W. Trichel, Phys. Rev. 55, 382 (1938).
http://dx.doi.org/10.1103/PhysRev.55.382
3.
S. Dahle, AIP Advances 5, 107234 (2015).
http://dx.doi.org/10.1063/1.4935102
4.
R. Morrow and J. J. Lowke, J. Phys. D: Appl. Phys. 30, 614 (1997).
http://dx.doi.org/10.1088/0022-3727/30/4/017
5.
Y. S. Zheng, B. Zhang, and J. L. He, Phys. Plasma. 18, 123503 (2011).
http://dx.doi.org/10.1063/1.3671970
6.
Y. S. Zheng, B. Zhang, and J. L. He, Phys. Plasma. 22, 063514 (2015).
http://dx.doi.org/10.1063/1.4923283
7.
B. He, T. W. Li, Y. P. Xiu, H. Zhao, Z. R. Peng, and Y. P. Meng, AIP Advances 6, 035114 (2016).
http://dx.doi.org/10.1063/1.4944623
8.
A. Luque, U. Ebert, C. Montijn, and W. Hundsdorfer, Appl. Phys. Lett. 90, 081501 (2007).
http://dx.doi.org/10.1063/1.2435934
9.
H. Bahrami and M. Tabrizchi, Talanta. 97, 400 (2012).
http://dx.doi.org/10.1016/j.talanta.2012.04.052
10.
R. P. C. Wiersma, J. Schaye, and B. D. Smith, Mon. Not. R. Astron. Soc. 393, 99 (2009).
http://dx.doi.org/10.1111/j.1365-2966.2008.14191.x
11.
R. Bussiahn, R. Brandenburg, T. Gerling, E. Kindel, H. Lange, N. Lembke et al., Appl. Phys. Lett. 96, 143701 (2010).
http://dx.doi.org/10.1063/1.3380811
12.
S. B. Turnipseed, J. E. Roybal, W. C. Andersen, and L. R. Kuck, Anal. Chim. Acta. 529, 159 (2005).
http://dx.doi.org/10.1016/j.aca.2004.07.061
13.
T. D. Guo, M. Chan, and S. J. Soldin, Arch. Pathol. Lab. Med. 128, 469 (2004).
14.
Y. Liu, X. Cui, T. B. Lu, X. B. Li, Z. G. Wang, Y. Xiang, and X. B. Wang, Chinese Phys. B 24, 065201 (2015).
http://dx.doi.org/10.1088/1674-1056/24/6/065201
15.
G. Sansone, F. Kelkensberg, J. F. Pérez-Torres, F. Morales, M. F. Kling, W. Siu et al., Nature 465, 763 (2010).
http://dx.doi.org/10.1038/nature09084
16.
R. Morrow, Phys. Rev. A 32, 1799 (1985).
http://dx.doi.org/10.1103/PhysRevA.32.1799
17.
D. K. Gupta, S. Mahajan, and P. I. John, J. Phys. D: Appl. Phys. 33, 681 (2000).
http://dx.doi.org/10.1088/0022-3727/33/6/315
18.
P. Sattari, G. S. P. Castle, and K. Adamiak, IEEE Trans. Ind. Appl. 47, 1935 (2011).
http://dx.doi.org/10.1109/TIA.2011.2156752
19.
Y. Teramoto, Y. Fukumoto, R. Ono, and T. Oda, IEEE Trans. Plasma. Sci. 39, 2218 (2011).
http://dx.doi.org/10.1109/TPS.2011.2161490
20.
E. G. da Costa, T. V. Ferreira, M. G. G. Neri, and I. B. A. D. Germano, IEEE Trans. Dielectr. Electr. Insul. 16, 985 (2009).
http://dx.doi.org/10.1109/TDEI.2009.5211844
21.
X. M. Bian, S. W. Wan, L. Liu, Y. J. Wang, J. M. K. MacAlpine, L. Chen et al., Appl. Phys. Lett. 103, 094102 (2013).
http://dx.doi.org/10.1063/1.4819880
22.
X. M. Bian, S. W. Wan, Y. J. Wang, and L. M. Wang, IEEJ T. Electr. Electr. 11, 133 (2016).
http://dx.doi.org/10.1002/tee.22198
23.
M. Aints, A. Haljaste, T. Plank, and L. Roots, Plasma. Process. Polym. 5, 672 (2008).
http://dx.doi.org/10.1002/ppap.200800031
24.
C. I. Blaga, F. Catoire, P. Colosimo, G. G. Paulus, H. G. Muller, P. Agostini, and L. F. Dimauro, Nat. Phys. 5, 335 (2009).
http://dx.doi.org/10.1038/nphys1228
25.
S. K. Dhali and P. F. Williams, J. Appl. Phys. 62, 4696 (1987).
http://dx.doi.org/10.1063/1.339020
26.
G. W. Penney and G. T. Hummert, J. Appl. Phys. 42, 572 (1970).
http://dx.doi.org/10.1063/1.1658715
27.
R. Morrow and T. R. Blackburn, IEEE Trans. Plasma. Sci. 27, 26 (1999).
http://dx.doi.org/10.1109/27.763010
28.
M. B. Zheleznyak, S. A. Mnatsakanyan, and S. V. Sizykh, High. Temp. 20, 357 (1982).
29.
P. Ségur, A. Bourdon, E. Marode, D. Bessieres, and J. H. Paillol, Plasma. Sources. Sci. Technol. 15, 648 (2006).
http://dx.doi.org/10.1088/0963-0252/15/4/009
30.
A. Bourdon, V. P. Pasko, N. Y. Liu, S. Celestin, P. Segur, and E. Marode, Plasma. Sources. Sci. Technol. 16, 656 (2007).
http://dx.doi.org/10.1088/0963-0252/16/3/026
31.
N. Y. Liu, S. Celestin, A. Bourdon, V. Pasko, and P. Segur, Appl. Phys. Lett. 91, 211501 (2007).
http://dx.doi.org/10.1063/1.2816906
32.
T. N. Tran, I. O. Golosnoy, P. L. Lewin, and G. E. Georghiou, J. Phys. D: Appl. Phys. 44, 015203 (2011).
http://dx.doi.org/10.1088/0022-3727/44/1/015203
33.
W. S. Kang, J. M. Park, Y. Kim, and S. H. Hong, IEEE Trans. Plasma. Sci. 31, 504 (2003).
34.
G. E. Georghiou, A. P. Papadakis, R. Morrow, and A. C. Metaxas, J. Phys. D: Appl. Phys. 38, R303 (2005).
http://dx.doi.org/10.1088/0022-3727/38/20/R01
35.
R. Morrow and N. Sato, J. Phys. D: Appl. Phys. 32, L20 (1999).
http://dx.doi.org/10.1088/0022-3727/32/5/005
36.
S. Pancheshnyi, M. Nudnova, and A. Starikovskii, Phys. Rev. E 71, 016407 (2005).
http://dx.doi.org/10.1103/PhysRevE.71.016407
37.
W. X. Sima, Q. J. Peng, Q. Yang, T. Yuan, and J. Shi, IEEE Trans. Dielectr. Electr. Insul. 19, 660 (2012).
38.
F. F. Wu, R. J. Liao, K. Wang, L. J. Yang, and S. Grzybowski, IEEE Trans. Plasma. Sci. 42, 868 (2014).
http://dx.doi.org/10.1109/TPS.2014.2302474
39.
N. Y. Liu, J. Geophys. Res. 109, A04301 (2004).
40.
Y. S. Akishev, I. V. Kochetov, A. I. Loboiko, and A. P. Napartovich, Plasma Phys. Rep. 28, 1049 (2002).
http://dx.doi.org/10.1134/1.1528237
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/content/aip/journal/adva/6/9/10.1063/1.4963077
2016-09-14
2016-12-03

Abstract

The effect of photoionization on the negative corona discharge was simulated based on the needle to plane air gaps. The Trichel pulse, pulse train, electron density and the distribution of electric field will be discussed in this manuscript. Effect of photoionization on the magnitude and interval of the first pulse will be discussed for different applied voltages. It is demonstrated that the peak of the first pulse current could be weakened by photoionization and a critical voltage of the first pulse interval influenced by photoionization was given.

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