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EVIDENCE OF HOLE INJECTION AND TRAPPING IN SILICON NITRIDE FILMS PREPARED BY REACTIVE SPUTTERING
1.S. M. Hu and L. V. Gregor, presented at the Electrochemical Society Meeting, Oct. 11, 1966, Philadelphia, Dielectrics Division.
2.J. R. Szedon, T. L. Chu, and G. A. Gruber, IEEE Solid State Device Research Conf., Northwestern University, June 1966.
3.J. Frenkel, Phys. Rev. 54, 647 (1938).
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