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Structural and transport characterization of ultra thin Ba0.05Sr0.95TiO3 layers grown over Nb electrodes for the development of Josephson junctions
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10.1063/1.3675332
/content/aip/journal/apl/100/1/10.1063/1.3675332
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/1/10.1063/1.3675332
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Topographic (left) and CAFM (right) 15 μm × 15 μm images of Nb/BSTO bilayers grown over Si with different BSTO thicknesses (0.67 nm (1), 0.83 nm (2), and 1 nm (3)).

Image of FIG. 2.
FIG. 2.

(Color online) CAFM I(V) curves for the superconducting/insulating bilayers grown over Si. The solid lines are a linear fits of the experimental data (Log(I) = A 0+ α · Log(V)). The inset shows A 0 and α as a function of the barrier thickness (d).

Image of FIG. 3.
FIG. 3.

(Color online) I/Vα 0 (Ln(I/Vα 0) = a 0 – d/λ) as a function of the polarization voltage for the Nb/BSTO bilayers with different thicknesses of the insulating layer (d). The inset shows I/Vα 0 as a function of d for a polarization voltage of around 2 V. The line is a linear fit of the experimental data.

Image of FIG. 4.
FIG. 4.

(Color online) Experimental (open dots) and simulated (lines) I/Vα 0 distributions for Nb/BSTO bilayers grown over Si, for different BSTO thicknesses.

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/content/aip/journal/apl/100/1/10.1063/1.3675332
2012-01-05
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural and transport characterization of ultra thin Ba0.05Sr0.95TiO3 layers grown over Nb electrodes for the development of Josephson junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/1/10.1063/1.3675332
10.1063/1.3675332
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