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(Color online) Results of Rietveld analysis of the XRD pattern. The inset presents SEM surface morphology.
(Color online) Temperature dependence of (a) the magnetization (M) and inverse susceptibility (1/χ) and (b) the differential magnetization (dM/dT) with a ZFC measured at 0.5 T. Inset of 2(a) shows magnetic hysteresis loops measured at 4 and 300 K; inset of 2(b) displays the partly enlarged dM/dT-T curve.
(Color online) Temperature dependence of (a) the dielectric constant (ɛ), (b) the differential dielectric constant (dɛ/dT), and (c) the dielectric loss (tan δ) measured at various frequencies. The higher and lower insets of (b) depict the partly enlarged dɛ/dT-T curve; the inset of 3(c) presents the relation between the peak temperature of tan δ and frequency according to the Arrhenius law.
(Color online) (a) Polarization versus electric field (P-E) loops; (b) the strain-electric filed (S-E) butterfly curve measured at room temperature. The upper-left and lower-right insets of (a) show the remnant polarization (Pr ) as a function of temperature (T) and the P-E loop at Tm , respectively.
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