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(Color online) SEM micrograph of the ARROW structure (a) and its refractive index profile (b).
(Color online) Intensity mode profile (Near field pattern) of output light from OPS-ARROW for (a) TE0, (b) TM0 polarizations, and (c) transverse cross section mode profile corresponding to the regions shown in (a) and (b) by a dashed line at λ = 1.55 μm.
(Color online) Calculated reflectance as a function of the thickness of the first cladding layer and for increasing core refractive index nc (a), and reflectance variation as a function of the core refractive index change Δnc (b). The inset is a zoom where the sensitivity was calculated for dc = 7 μm and d2 = 3.2 μm.
(Color online) Transverse cross section intensity mode profile for TE0 (a) and TM0 (b) from OPS-ARROW (dashed line) and functionalized OPS-ARROW (solid line) at λ = 1.55 μm.
Anodization conditions, thickness and refractive index for the OPS-ARROW structure.
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