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1/f noise of Josephson-junction-embedded microwave resonators at single photon energies and millikelvin temperatures
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10.1063/1.3700964
/content/aip/journal/apl/100/14/10.1063/1.3700964
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/14/10.1063/1.3700964

Figures

Image of FIG. 1.
FIG. 1.

(a) Measurement setup. (Insets) Optical and SEM images of a characteristic LE sample and embedded Josephson junction. (b) The spectral density of frequency fluctuations at 0.1 Hz as a function of resonator photon number, , for CPW and LE resonators. (c) The critical current noise sensitivity for CPW (red) and LE (black) embedding geometries as a function of the Josephson inductance participation ratio.

Image of FIG. 2.
FIG. 2.

1/f frequency noise of Josephson-junction-embedded resonators. (a) The measured frequency noise of junction-embedded samples and the co-fabricated linear resonator. (b) The measured critical current noise assuming all the frequency noise is attributed to critical current fluctuations of the junction. (c) Temperature dependence of the junction-embedded resonators. (d) The spectral density of frequency noise (left axis) and equivalent critical current noise noise (right axis) for sample F at temperatures up to 250 mK.

Tables

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Table I.

Sample parameters. Sample A was a linear LE resonator. Sample D incorporated a single junction rather than 2 junctions in a SQUID geometry. The critical current and participation ratio were determined from the resonance frequency of the samples. The linear inductance was calculated from finite element simulations.

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/content/aip/journal/apl/100/14/10.1063/1.3700964
2012-04-04
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: 1/f noise of Josephson-junction-embedded microwave resonators at single photon energies and millikelvin temperatures
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/14/10.1063/1.3700964
10.1063/1.3700964
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