Full text loading...
(a) AFM topographic image and (b) the energy band diagram of the device (AFM tip/sample contact). (c) and (d) are the corresponding electric images obtained in NC30 under (−3 V) and (+3 V), respectively (just after e-beam irradiation in the condition of nano-EBIC imaging).
Schematic representation of the current kinetics measurement procedure. The C-AFM tip is permanently in contact with the sample surface, the focused e-beam impact (E = 5 keV and I = 2 nA) is at a fixed position away from the tip of about L ∼ 0.5 µm, where L is the distance corresponding to the hole effective diffusion length measured at E = 5 keV and I = 2 nA.9
Current kinetics through NCs in: (a) NC30 and NC60, and (b) NC0 during cycles of irradiation (i.e., when the e-beam is first turned on, off, …). (c) gives an enlarged part of the current kinetics through NC60.
Typical example of the determination of the charging time constant from a fitting process by an exponential law for NC30.
Article metrics loading...