1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Experimental evidence for the correlation between the weak inversion hump and near midgap states in dielectric/InGaAs interfaces
Rent:
Rent this article for
USD
10.1063/1.4704925
/content/aip/journal/apl/100/17/10.1063/1.4704925
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/17/10.1063/1.4704925
/content/aip/journal/apl/100/17/10.1063/1.4704925
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/100/17/10.1063/1.4704925
2012-04-24
2014-10-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental evidence for the correlation between the weak inversion hump and near midgap states in dielectric/InGaAs interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/17/10.1063/1.4704925
10.1063/1.4704925
SEARCH_EXPAND_ITEM