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Apparent Raman spectral shifts from nano-structured surfaces
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10.1063/1.4704928
/content/aip/journal/apl/100/17/10.1063/1.4704928
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/17/10.1063/1.4704928
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of microscope and spectrometer setup showing how the fine size of the focal spot influences the spectroscopic signal.

Image of FIG. 2.
FIG. 2.

Top: schematic of two sample orientations with respect to spectrometer entrance slit and direction of polarization. The trenches of the substrate are either oriented parallel or perpendicular to the spectrometer entrance slit. Bottom: AFM image of trenches (600 nm wide, 500 nm deep, distance between trenches: 2100 nm).

Image of FIG. 3.
FIG. 3.

Spectral position and intensity of Raman LO phonon in GaAs when scanning either perpendicular (parallel to trenches) or parallel (perpendicular to trenches) with respect to the spectrometer entrance slit.

Image of FIG. 4.
FIG. 4.

Effect of over and under focusing when scanning perpendicular to the spectrometer entrance slit. The spot size after defocusing has been double the size when compared to the spot size when focused.

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/content/aip/journal/apl/100/17/10.1063/1.4704928
2012-04-24
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Apparent Raman spectral shifts from nano-structured surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/17/10.1063/1.4704928
10.1063/1.4704928
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