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Ultrahigh dielectric constant of thin films obtained by electrostatic force microscopy and artificial neural networks
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10.1063/1.3675446
/content/aip/journal/apl/100/2/10.1063/1.3675446
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/2/10.1063/1.3675446
/content/aip/journal/apl/100/2/10.1063/1.3675446
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/content/aip/journal/apl/100/2/10.1063/1.3675446
2012-01-09
2014-08-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrahigh dielectric constant of thin films obtained by electrostatic force microscopy and artificial neural networks
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/2/10.1063/1.3675446
10.1063/1.3675446
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