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(a) The three-dimensional schematic diagram of the Au-Al2O3 core-shell NCs structure memory. (b) AFM image of planar view for Au-Al2O3 core-shell NCs. (c) STEM image of the cross-section of Au-Al2O3 core-shell NCs structure and inset shows the high-resolution TEM images. (d) XPS spectrums of Al2p and Au4f for sample1 and sample2. Inset is the XPS spectrums of Hf4f for the two samples.
(a) The normalized high frequency C-V curves under ±8 V sweep voltage for three samples. (b) High-frequency C–V hysteresis under different sweep voltage ranges for sample1.
(a) P/E characteristics for two samples and inset shows the energy band of sample1 and (b) endurance characteristics of sample1.
(a) Data retentions for sample1 and sample2 at room temperature. (b) Inset shows the schematic diagram of the possible charge loss mechanisms. (b) Retention characteristics for sample1 and sample2 at various temperatures. Inset shows Energy band diagrams of the programed states for sample1.
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