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Silicon nanowire atomic force microscopy probes for high aspect ratio geometries
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10.1063/1.4720406
/content/aip/journal/apl/100/21/10.1063/1.4720406
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/21/10.1063/1.4720406
/content/aip/journal/apl/100/21/10.1063/1.4720406
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/content/aip/journal/apl/100/21/10.1063/1.4720406
2012-05-22
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Silicon nanowire atomic force microscopy probes for high aspect ratio geometries
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/21/10.1063/1.4720406
10.1063/1.4720406
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