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Terahertz time-domain spectroscopy of anisotropic complex conductivity tensors in silicon nanowire films
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10.1063/1.4721490
/content/aip/journal/apl/100/21/10.1063/1.4721490
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/21/10.1063/1.4721490
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Figures

Image of FIG. 1.
FIG. 1.

(a) SEM images of vertically aligned SiNWs (average diameter: ∼90 nm; average length: ∼3 μm) on a silicon substrate and (b) equivalent dielectric layers, where ε is the effective complex permittivity tensor of the SiNW film, which is regarded as a homogeneous anisotropic medium, and ε 0 and ε Si are the relative permittivities of air and the silicon substrate, respectively.

Image of FIG. 2.
FIG. 2.

(a) Measured (symbols) and calculated (lines) THz pulses transmitted through the SiNW sample at incidence angles θ of 0° (circles) and 40° (triangles). (b) Amplitude spectra of the same transmitted THz pulses. The inset shows the phase difference between the transmitted THz pulses for θ = 0° and 40°.

Image of FIG. 3.
FIG. 3.

Real (blue) and imaginary (red) conductivities of (a) bare Si substrate and (b) SiNW film. The transverse and longitudinal conductivities are represented by circles and triangles, respectively. The symbols and the lines stand for the experimental data and the calculation results, respectively.

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/content/aip/journal/apl/100/21/10.1063/1.4721490
2012-05-22
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Terahertz time-domain spectroscopy of anisotropic complex conductivity tensors in silicon nanowire films
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/21/10.1063/1.4721490
10.1063/1.4721490
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