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Correlating whisker growth and grain structure on Sn-Cu samples by real-time scanning electron microscopy and backscattering diffraction characterization
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10.1063/1.4721661
/content/aip/journal/apl/100/22/10.1063/1.4721661
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/22/10.1063/1.4721661
/content/aip/journal/apl/100/22/10.1063/1.4721661
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/content/aip/journal/apl/100/22/10.1063/1.4721661
2012-05-29
2014-07-12
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlating whisker growth and grain structure on Sn-Cu samples by real-time scanning electron microscopy and backscattering diffraction characterization
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/22/10.1063/1.4721661
10.1063/1.4721661
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