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The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors
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10.1063/1.4722787
/content/aip/journal/apl/100/22/10.1063/1.4722787
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/22/10.1063/1.4722787
/content/aip/journal/apl/100/22/10.1063/1.4722787
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/content/aip/journal/apl/100/22/10.1063/1.4722787
2012-05-29
2014-09-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/22/10.1063/1.4722787
10.1063/1.4722787
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