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(a) and (b) SEM pictures of the patterns in the percolated network stage for two sample initial thicknesses h. Scale bar is 500 nm. In each inset, the Fourier spectrum of the SEM image is shown. (c) Characteristic wavelength vs. initial film thickness h. Two different fits with power law are reported for () and for (). (d) Critical ion dose which was needed to get the rupture of the Cr film and linear fit for experimental data with (). In all plots, the error bars are at .
Steps followed in the simulations between to subsequent ion impacts (occurring at the site marked with circles). For simplicity, only two of the eight trial configurations have been considered. Each arrow start from a minimum energy configuration. The next ion impact is considered when all the eight trial configurations have an energy higher than the starting configuration.
(a) Simulated surface evolution for h = 2.1 nm and increasing dose d. (b) Simulated wavelength dependence vs initial film thickness () for a systems with sputtering (red triangles) and without sputtering (blue squares) and corresponding experimental data (black filled circles). The green line is the power law fit for the system without sputtering (exponent ). (b) Critical dose as obtained from simulation with sputtering (red triangles) and without sputtering (blue squares) compared with experimental data (filled circles).
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