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Ultrafast photoluminescence from freestanding Si nanocrystals
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10.1063/1.4729605
/content/aip/journal/apl/100/25/10.1063/1.4729605
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729605
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

HRTEM images and size-distribution histograms of (a) S-Si NCs and (b) F-Si NCs fabricated from SiO1.2/SiO2 multilayers.

Image of FIG. 2.
FIG. 2.

Si 2p core-level XPS spectra of the same samples used in Fig. 1. Two main XPS peaks at 99.7 and 103.7 eV correspond to a metallic Si (Si0+) and a fully oxidated SiO2 (Si4+), respectively.

Image of FIG. 3.
FIG. 3.

Normalized PL spectra of the same samples used in Fig. 1.

Image of FIG. 4.
FIG. 4.

(a) PL decay curves in the short-time region for the same samples used in Fig. 1. (b) PL decay curve in the long-time region for the same S-Si NCs used in Fig. 1.

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/content/aip/journal/apl/100/25/10.1063/1.4729605
2012-06-18
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrafast photoluminescence from freestanding Si nanocrystals
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729605
10.1063/1.4729605
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