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HRTEM images and size-distribution histograms of (a) S-Si NCs and (b) F-Si NCs fabricated from SiO1.2/SiO2 multilayers.
Si 2p core-level XPS spectra of the same samples used in Fig. 1. Two main XPS peaks at 99.7 and 103.7 eV correspond to a metallic Si (Si0+) and a fully oxidated SiO2 (Si4+), respectively.
Normalized PL spectra of the same samples used in Fig. 1.
(a) PL decay curves in the short-time region for the same samples used in Fig. 1. (b) PL decay curve in the long-time region for the same S-Si NCs used in Fig. 1.
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