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Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
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10.1063/1.4729785
/content/aip/journal/apl/100/25/10.1063/1.4729785
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729785
/content/aip/journal/apl/100/25/10.1063/1.4729785
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/content/aip/journal/apl/100/25/10.1063/1.4729785
2012-06-19
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729785
10.1063/1.4729785
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