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Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
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10.1063/1.4729785
/content/aip/journal/apl/100/25/10.1063/1.4729785
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729785
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Figures

Image of FIG. 1.
FIG. 1.

(a) Spintronic Michelson interferometry experimental set-up, through which the microwave signal is coherently split into two paths and finally coupled at the sensor, enabling phase imaging. A lock-in preamplifier is used to measure the induced PV signal. (b) The Py strip sensor is oriented along the y direction, when applying an external magnetic field in the x direction. (c) Amplitude of the PV showing a linear relationship with the external magnetic field H. (d) Experimental PV as a function of the relative phase for different external fields. From smallest amplitude, the external magnetic fields are 0.5 mT, 1 mT, 2 mT, and 4 mT.

Image of FIG. 2.
FIG. 2.

(a) Phase image of the dielectric grating from near field to far field at 9.4 GHz obtained by scanning the grating along the x and z directions with respect to the sensor. The engraved channels are filled with water. (b) Simulation of the microwave electric field phase distribution in the x-z plane at 9.4 GHz for the dielectric grating using comsol software. Phase distribution along the x direction at z = −2 mm, −5 mm, and −10 mm for experimental results (c) and simulation (d).

Image of FIG. 3.
FIG. 3.

(a) Electric field phase distribution of the grating in the x-z plane detected by a monopole antenna and VNA system at 8.5 GHz. (b) Simulation of the electric field phase distribution in the x-z plane for the dielectric grating using comsol software at 8.5 GHz.

Image of FIG. 4.
FIG. 4.

(a) A photograph of the sample under test with the dashed lines indicating the image area and the hole position. The near field phase image of the sample with a copper disc buried in the hole (b) and with a water filled hole (c).

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/content/aip/journal/apl/100/25/10.1063/1.4729785
2012-06-19
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/25/10.1063/1.4729785
10.1063/1.4729785
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