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Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems
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10.1063/1.4730625
/content/aip/journal/apl/100/26/10.1063/1.4730625
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/26/10.1063/1.4730625
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Figures

Image of FIG. 1.
FIG. 1.

(a) MLCC sample for x-ray tomography; (b), (c) 2D projection images before and after sintering, respectively; (d), (e) reconstructed 3D microstructure before and after sintering, respectively.

Image of FIG. 2.
FIG. 2.

(a) Discontinuities of electrode, defined as percentage of uncovered areas over the total electrode area; (b) axial and radial strains in different BT layers, irregular top BT layer (#1) was not considered and (c) relative densities of BT layers, calculated from the percentage of solid volume over the whole layer volume.

Image of FIG. 3.
FIG. 3.

Microstructural changes of MLCC sample (Ni in purple, BT in green and pores in yellow): (a) multilayer before sintering, (b) pore network before sintering, (c) multilayer after sintering, and (d) pores after sintering.

Image of FIG. 4.
FIG. 4.

Morphology of inner electrode #2: (a) initial microstructure and (b) final microstructures after sintering, respectively. Microstructures of electrodes #3-4 (not present) are similar to that of electrode #2.

Image of FIG. 5.
FIG. 5.

Schematic of the defect evolution mechanism during sintering.

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/content/aip/journal/apl/100/26/10.1063/1.4730625
2012-06-26
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/26/10.1063/1.4730625
10.1063/1.4730625
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